Inventor · disambiguated record
Marc E. Levitt
Also filed as: LEVITT MARC · LEVITT MARC E · LEVITT MARC ELLIOT
16 granted patents·398 citations·filing 1991–2010
95Inventor score
Top patents by PatentIndex Score
16 records- 0180US5787012AIntegrated circuit with identification signal writing circuitry distributed on multiple metal layersSUN MICROSYSTEMS INC·Filed 1995·Granted Jul 28, 1998·64 cites·20 claims
- 0279US5900757AClock stopping schemes for data bufferSUN MICROSYSTEMS INC·Filed 1996·Granted May 4, 1999·52 cites·16 claims
- 0379US5774474APipelined scan enable for fast scan testingSUN MICROSYSTEMS INC·Filed 1996·Granted Jun 30, 1998·45 cites·18 claims
- 0478US5341382AMethod and apparatus for improving fault coverage of system logic of an integrated circuit with embedded memory arraysSUN MICROSYSTEMS INC·Filed 1991·Granted Aug 23, 1994·42 cites·29 claims
- 0571US8549339B2Processor core communication in multi-core processorWOLFE ANDREW·Filed 2010·Granted Oct 1, 2013·3 cites·23 claims
- 0669US5570376AMethod and apparatus for identifying faults within a systemSUN MICROSYSTEMS INC·Filed 1994·Granted Oct 29, 1996·52 cites·30 claims
- 0766US5513186AMethod and apparatus for interconnect testing without speed degradationSUN MICROSYSTEMS INC·Filed 1993·Granted Apr 30, 1996·26 cites·17 claims
- 0860US5898702AMutual exclusivity circuit for use in test pattern application scan architecture circuitsSUN MICROSYSTEMS INC·Filed 1997·Granted Apr 27, 1999·23 cites·15 claims
- 0958US5850150AFinal stage clock buffer in a clock distribution networkSUN MICROSYSTEMS INC·Filed 1996·Granted Dec 15, 1998·21 cites·27 claims
- 1056US5864564AControl circuit for deterministic stopping of an integrated circuit internal clockSUN MICROSYSTEMS INC·Filed 1995·Granted Jan 26, 1999·20 cites·19 claims
- 1152US6081913AMethod for ensuring mutual exclusivity of selected signals during application of test patternsSUN MICROSYSTEMS INC·Filed 1997·Granted Jun 27, 2000·17 cites·10 claims
- 1245US5870408AMethod and apparatus for on die testingSUN MICROSYSTEMS INC·Filed 1996·Granted Feb 9, 1999·13 cites·31 claims
- 1339US5872796AMethod for interfacing boundary-scan circuitry with linearized impedance control type output driversSUN MICROSYSTEMS INC·Filed 1997·Granted Feb 16, 1999·8 cites·25 claims
- 1432US5892778ABoundary-scan circuit for use with linearized impedance control type output driversSUN MICROSYSTEMS INC·Filed 1997·Granted Apr 6, 1999·4 cites·24 claims
- 1532US5379303AMaximizing improvement to fault coverage of system logic of an integrated circuit with embedded memory arraysSUN MICROSYSTEMS INC·Filed 1991·Granted Jan 3, 1995·3 cites·26 claims
- 1629US5528165ALogic signal validity verification apparatusSUN MICROSYSTEMS INC·Filed 1995·Granted Jun 18, 1996·5 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →