Inventor · disambiguated record
Manny K. F. Ma
Also filed as: MA MANNY · MA MANNY K · MA MANNY K F · MA MANNY KIN
112 granted patents·1,954 citations·filing 1995–2007
99Inventor score
Files withMICRON TECHNOLOGY INC112
Top patents by PatentIndex Score
112 records- 0198US6069506AMethod and apparatus for improving the performance of digital delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 1998·Granted May 30, 2000·175 cites·50 claims
- 0296US6316976B1Method and apparatus for improving the performance of digital delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 13, 2001·69 cites·14 claims
- 0396US5578941AVoltage compensating CMOS input buffer circuitMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 26, 1996·108 cites·24 claims
- 0491US5885864AMethod for forming compact memory cell using vertical devicesMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 23, 1999·75 cites·4 claims
- 0591US5677567ALeads between chips assemblyMICRON TECHNOLOGY INC·Filed 1996·Granted Oct 14, 1997·93 cites·29 claims
- 0689US6504396B2Method for adjusting an output slew rate of a bufferMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 7, 2003·30 cites·9 claims
- 0789US6022787AMethod of making a structure for providing signal isolation and decoupling in an integrated circuit deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 8, 2000·96 cites·11 claims
- 0887US6809386B2Cascode I/O driver with improved ESD operationMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 26, 2004·33 cites·60 claims
- 0987US5729047AMethod and structure for providing signal isolation and decoupling in an integrated circuit deviceMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 17, 1998·85 cites·18 claims
- 1086US6208018B1Piggyback multiple dice assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 27, 2001·80 cites·21 claims
- 1183US6194235B1Method of fabricating and testing an embedded semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 27, 2001·22 cites·20 claims
- 1283US5661428AFrequency adjustable, zero temperature coefficient referencing ring oscillator circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Aug 26, 1997·40 cites·17 claims
- 1382US6078538AMethod and apparatus for reducing bleed currents within a DRAM array having row-to-column shortsMICRON TECHNOLOGY INC·Filed 1998·Granted Jun 20, 2000·29 cites·23 claims
- 1481US5894165ALeads between chips assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 13, 1999·45 cites·8 claims
- 1580US7903379B2Cascode I/O driver with improved ESD operationMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 8, 2011·6 cites·41 claims
- 1680US5654860AWell resistor for ESD protection of CMOS circuitsMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 5, 1997·35 cites·28 claims
- 1779US6204537B1ESD protection schemeMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 20, 2001·39 cites·48 claims
- 1879US5834813AField-effect transistor for one-time programmable nonvolatile memory elementMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 10, 1998·40 cites·13 claims
- 1978US6472893B2Test socket and methodsMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 29, 2002·14 cites·23 claims
- 2078US6028799AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 22, 2000·17 cites·7 claims
- 2176US7253064B2Cascode I/O driver with improved ESD operationMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 7, 2007·15 cites·38 claims
- 2276US5877993AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 2, 1999·16 cites·12 claims
- 2375US5770480AMethod of leads between chips assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 23, 1998·35 cites·15 claims
- 2473US5663919AMemory device with regulated power supply controlMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 2, 1997·26 cites·16 claims
- 2572US6011386AFrequency adjustable, zero temperature coefficient referencing ring oscillator circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 4, 2000·23 cites·15 claims
- 2671US6310802B1Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shortsMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 30, 2001·10 cites·23 claims
- 2771US6232148B1Method and apparatus leads-between-chipsMICRON TECHNOLOGY INC·Filed 1999·Granted May 15, 2001·31 cites·7 claims
- 2870US6355508B1Method for forming electrostatic discharge protection device having a graded junctionMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 12, 2002·25 cites·8 claims
- 2970US6259621B1Method and apparatus for minimization of data line coupling in a semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 10, 2001·16 cites·17 claims
- 3069US6778452B2Circuit and method for voltage regulation in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 17, 2004·6 cites·10 claims
- 3169US6040733ATwo-stage fusible electrostatic discharge protection circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 21, 2000·21 cites·12 claims
- 3269US5767552AStructure for ESD protection in semiconductor chipsMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 16, 1998·25 cites·19 claims
- 3368US6350634B2Semiconductor device having a built-in heat sink and process of manufacturing sameMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 26, 2002·12 cites·8 claims
- 3468US6054334AMethods and structures for pad reconfiguration to allow intermediate testing during manufacture of an integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 25, 2000·25 cites·68 claims
- 3568US5923899ASystem for generating configuration output signal responsive to configuration input signal, enabling configuration, and providing status signal identifying enabled configuration responsive to the output signalMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 13, 1999·27 cites·25 claims
- 3667US6624660B2CMOS output driver for semiconductor device and related method for improving latch-up immunity in a CMOS output driverMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 23, 2003·13 cites·18 claims
- 3767US5880917AWell resistor for ESD protection of CMOS circuitsMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 9, 1999·20 cites·28 claims
- 3865US6593218B2Electrostatic discharge protection device having a graded junction and method for forming the sameMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 15, 2003·8 cites·9 claims
- 3965US5844370AMatrix addressable display with electrostatic discharge protectionMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 1, 1998·14 cites·2 claims
- 4064US6653220B2Advance metallization processMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 25, 2003·9 cites·5 claims
- 4164US6300788B1Buffer with adjustable slew rate and a method of providing an adjustable slew rateMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 9, 2001·8 cites·17 claims
- 4264US6068892AMethods and structures for pad reconfiguration to allow intermediate testing during manufacture of an integrated circuitMICRON TECHNOLOGY INC·Filed 1999·Granted May 30, 2000·21 cites·8 claims
- 4363US6365937B1Electrostatic discharge protection device having a graded junctionMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 2, 2002·18 cites·45 claims
- 4463US6303445B1Method of ESD protection schemeMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 16, 2001·9 cites·12 claims
- 4563US6226221B1Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shortsMICRON TECHNOLOGY INC·Filed 2000·Granted May 1, 2001·7 cites·6 claims
- 4663US5656967ATwo-stage fusible electrostatic discharge protection circuitMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 12, 1997·17 cites·19 claims
- 4761US6137664AWell resistor for ESD protection of CMOS circuitsMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 24, 2000·15 cites·60 claims
- 4861US6011731ACell plate regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 4, 2000·7 cites·16 claims
- 4960US6682954B1Method for employing piggyback multiple die #3MICRON TECHNOLOGY INC·Filed 1997·Granted Jan 27, 2004·25 cites·9 claims
- 5060US6300668B2High resistance integrated circuit resistorMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 9, 2001·19 cites·39 claims
Showing the top 50 of 112 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →