Inventor · disambiguated record
Masami Makuuchi
Also filed as: MAKUUCHI MASAMI
32 granted patents·7 pending applications·361 citations·filing 1998–2021
95Inventor score
Top patents by PatentIndex Score
39 records- 0195US6176433B1Reader/writer having coil arrangements to restrain electromagnetic field intensity at a distanceHITACHI LTD·Filed 1998·Granted Jan 23, 2001·262 cites·17 claims
- 0289US11143600B2Defect inspection deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 12, 2021·6 cites·10 claims
- 0386US10830706B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 10, 2020·2 cites·16 claims
- 0486US10458924B2Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 29, 2019·3 cites·8 claims
- 0585US9576769B2Weak signal detection system and electron microscope equipped with sameHITACHI LTD·Filed 2014·Granted Feb 21, 2017·7 cites·5 claims
- 0685US6894489B2Testing apparatus for conducting a test on a magnetic recording medium or a magnetic head, through recording test data on the magnetic recording medium and reproducing recorded test data therefrom by means of the magnetic headHITACHI HIGH TECH ELECT ENG CO·Filed 2003·Granted May 17, 2005·19 cites·4 claims
- 0777US6700369B1Testing apparatus of magnetic recording medium or magnetic head including a plurality of analog-to-digital converters which convert reproduced testing data into digital dataHITACHI LTD·Filed 2000·Granted Mar 2, 2004·11 cites·30 claims
- 0873US8000047B2Inspection apparatus and inspection method of magnetic disk or magnetic headHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 16, 2011·2 cites·12 claims
- 0969US8000045B2Inspection apparatus and inspection method of magnetic disk or magnetic headHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 16, 2011·1 cites·11 claims
- 1068US11143598B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2020·Granted Oct 12, 2021·0 cites·18 claims
- 1168US7276900B2Magnetic characteristic inspecting apparatus and inspecting method using itHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 2, 2007·1 cites·18 claims
- 1265US11199511B2Medium sensor device and monitoring systemHITACHI LTD·Filed 2018·Granted Dec 14, 2021·1 cites·12 claims
- 1365US10401304B2Examination deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Sep 3, 2019·0 cites·3 claims
- 1461US7474290B2Semiconductor device and testing method thereofRENESAS TECH CORP·Filed 2004·Granted Jan 6, 2009·7 cites·4 claims
- 1560US7443373B2Semiconductor device and the method of testing the sameRENESAS TECH CORP·Filed 2004·Granted Oct 28, 2008·6 cites·12 claims
- 1659US10107762B2Examination deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 23, 2018·0 cites·7 claims
- 1759US7358953B2Semiconductor device and testing method of semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Apr 15, 2008·6 cites·15 claims
- 1857US12276618B2Defect inspection deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Apr 15, 2025·0 cites·9 claims
- 1956US2025224342A1Optical-type foreign matter inspection deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2054US12422377B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 23, 2025·0 cites·9 claims
- 2154US7668027B2Semiconductor device, testing and manufacturing methods thereofRENESAS TECH CORP·Filed 2006·Granted Feb 23, 2010·4 cites·12 claims
- 2253US2024044806A1Optical foreign matter inspection deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2352US7990529B2Detection circuit and foreign matter inspection apparatus for semiconductor waferHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 2, 2011·0 cites·6 claims
- 2450US12044627B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 23, 2024·0 cites·12 claims
- 2550US9779912B2Inspection device and measurement deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 3, 2017·0 cites·6 claims
- 2650US8035071B2Contamination-inspecting apparatus and detection circuitHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 11, 2011·0 cites·9 claims
- 2748US9261475B2Inspection equipment and inspection methodMAKUUCHI MASAMI·Filed 2011·Granted Feb 16, 2016·0 cites·18 claims
- 2848US7132997B2Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probeHITACHI LTD·Filed 2003·Granted Nov 7, 2006·6 cites·8 claims
- 2947US11346791B2Inspection device and inspection method thereofHITACHI HIGH TECH CORP·Filed 2018·Granted May 31, 2022·0 cites·7 claims
- 3044US8908171B2Defect inspection method and defect inspection deviceMAKUUCHI MASAMI·Filed 2011·Granted Dec 9, 2014·0 cites·10 claims
- 3143US6164532APower transmission system, power transmission/communication system and reader and/or writerHITACHI LTD·Filed 1998·Granted Dec 26, 2000·17 cites·15 claims
- 3243US2015293034A1Inspection device and inspection methodHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 3341US2015012249A1Minute Signal Detection Method and SystemHITACHI LTD·Filed 2013·Application pending·0 cites
- 3441US2012313650A1Inspection device and inspection methodKAWAGUCHI HIROSHI·Filed 2010·Application pending·0 cites
- 3538US9698783B2Driver integrated circuitLI WEN·Filed 2012·Granted Jul 4, 2017·0 cites·7 claims
- 3638US2012194939A1Patterned medium inspection method and inspection apparatusNISHIMOTO TAKUMA·Filed 2011·Application pending·0 cites
- 3737US2011211277A1Detecting circuit and inspecting apparatusNISHIMOTO TAKUMA·Filed 2011·Application pending·0 cites
- 3836US8563925B2Mass spectroscope and its adjusting methodHITACHI HIGH TECH CORP·Filed 2012·Granted Oct 22, 2013·0 cites·14 claims
- 3936US8451063B2Wideband low noise sensor amplifier circuitTAKAHASHI MASAYOSHI·Filed 2010·Granted May 28, 2013·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →