Inventor · disambiguated record
Manjusha Mehendale
Also filed as: MEHENDALE MANJUSHA · MEHENDALE MANJUSHA S
9 granted patents·9 pending applications·28 citations·filing 2001–2024
82Inventor score
Files withONTO INNOVATION INC12MEHENDALE MANJUSHA2CA NAT RESEARCH COUNCIL1RUDOLPH TECH INC1RUDOLPH TECHNOLOGIES INC1
Top patents by PatentIndex Score
18 records- 0185US9576862B2Optical acoustic substrate assessment system and methodRUDOLPH TECH INC·Filed 2014·Granted Feb 21, 2017·8 cites·9 claims
- 0285US2025327737A1Opto-acoustic microscopy using an instantaneous signal difference between signals from two discrete delay times acquired with a single probe beamONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 0381US2025327924A1On-the-fly opto-acoustic microscopyONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 0479US2025327758A1Metrology based on time resolved non-acoustic signalsONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 0578US9991176B2Non-destructive acoustic metrology for void detectionMEHENDALE MANJUSHA·Filed 2015·Granted Jun 5, 2018·3 cites·23 claims
- 0674US2024402074A1Non-destructive inspection and manufacturing metrology systems and methodsONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 0773US9140601B2Position sensitive detection optimizationMEHENDALE MANJUSHA·Filed 2012·Granted Sep 22, 2015·4 cites·11 claims
- 0865US6884960B2Methods for creating optical structures in dielectrics using controlled energy depositionCA NAT RESEARCH COUNCIL·Filed 2001·Granted Apr 26, 2005·13 cites·10 claims
- 0965US2024329005A1Multi pump-probe encoding-decoding for opto-acoustic metrologyONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 1062US2024337627A1System and method for fast microscopyONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 1161US12092565B2Non-destructive inspection and manufacturing metrology systems and methodsONTO INNOVATION INC·Filed 2020·Granted Sep 17, 2024·0 cites·18 claims
- 1260US12474643B2System and method for performing alignment and overlay measurement through an opaque layerONTO INNOVATION INC·Filed 2021·Granted Nov 18, 2025·0 cites·23 claims
- 1359US11988641B2Characterization of patterned structures using acoustic metrologyONTO INNOVATION INC·Filed 2021·Granted May 21, 2024·0 cites·23 claims
- 1458US2025189446A1System and method for performing characterization of a sample using multi-wavelength laser acousticsONTO INNOVATION INC·Filed 2022·Application pending·0 cites
- 1550US11668644B2Opto-acoustic measurement of a transparent film stackONTO INNOVATION INC·Filed 2021·Granted Jun 6, 2023·0 cites·20 claims
- 1649US2025189605A1System and method for performing characterization of a sampleONTO INNOVATION INC·Filed 2022·Application pending·0 cites
- 1741US7903238B2Combination of ellipsometry and optical stress generation and detectionRUDOLPH TECHNOLOGIES INC·Filed 2007·Granted Mar 8, 2011·0 cites·24 claims
- 1834US2005167410A1Methods for creating optical structures in dielectrics using controlled energy depositionFiled 2005·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Manjusha Mehendale files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →