Inventor · disambiguated record
Masaaki Minowa
Also filed as: MINOWA MASAAKI
22 granted patents·3 pending applications·138 citations·filing 2010–2020
95Inventor score
Top patents by PatentIndex Score
25 records- 0196US10186532B2Image device, image system, and control method of image deviceCANON KK·Filed 2016·Granted Jan 22, 2019·18 cites·19 claims
- 0295US9900539B2Solid-state image pickup element, and image pickup systemCANON KK·Filed 2016·Granted Feb 20, 2018·16 cites·17 claims
- 0395US9232164B2Solid-state image sensor, camera, and method of driving solid-state image sensorCANON KK·Filed 2013·Granted Jan 5, 2016·24 cites·13 claims
- 0493US9773827B2Solid-state image sensor and camera where the plurality of pixels form a pixel group under a single microlensCANON KK·Filed 2015·Granted Sep 26, 2017·7 cites·21 claims
- 0593US8749683B2Driving method of solid-state imaging deviceCANON KK·Filed 2012·Granted Jun 10, 2014·16 cites·12 claims
- 0692US8773560B2Method for driving image pickup apparatusCANON KK·Filed 2012·Granted Jul 8, 2014·11 cites·13 claims
- 0791US8525896B2Solid-state imaging apparatusOKITA AKIRA·Filed 2010·Granted Sep 3, 2013·8 cites·16 claims
- 0890US8928791B2Method for driving image pickup apparatusCANON KK·Filed 2014·Granted Jan 6, 2015·8 cites·16 claims
- 0988US9300884B2Solid-state image sensor and camera having a plurality of photoelectric converters under a microlensCANON KK·Filed 2012·Granted Mar 29, 2016·6 cites·8 claims
- 1087US10504947B2Solid-state image sensor and cameraCANON KK·Filed 2017·Granted Dec 10, 2019·3 cites·40 claims
- 1187US8921855B2Test circuit for testing signal receiving unit, image pickup apparatus, method of testing signal receiving unit, and method of testing image pickup apparatusOKITA AKIRA·Filed 2012·Granted Dec 30, 2014·6 cites·7 claims
- 1285US11348953B2Solid-state image sensor and cameraCANON KK·Filed 2019·Granted May 31, 2022·2 cites·39 claims
- 1384US9172951B2Test circuit for testing signal receiving unit, image pickup apparatus, method of testing signal receiving unit, and method of testing image pickup apparatusCANON KK·Filed 2014·Granted Oct 27, 2015·4 cites·5 claims
- 1482US9761618B2Solid-state imaging apparatus, method for manufacturing the same, and imaging systemCANON KK·Filed 2014·Granted Sep 12, 2017·3 cites·22 claims
- 1581US10033953B2Solid state imaging device and imaging system which reduces noise caused by magnetic field fluctuationCANON KK·Filed 2016·Granted Jul 24, 2018·3 cites·17 claims
- 1674US9947702B2Solid-state imaging apparatus, method for manufacturing the same, and imaging systemCANON KK·Filed 2017·Granted Apr 17, 2018·1 cites·18 claims
- 1764US9794497B2Solid-state imaging device controlling read-out of signals from pixels in first and second areasCANON KK·Filed 2015·Granted Oct 17, 2017·1 cites·19 claims
- 1859US10217780B2Solid-state imaging apparatus, method for manufacturing the same, and imaging systemCANON KK·Filed 2018·Granted Feb 26, 2019·0 cites·58 claims
- 1958US8817151B2Solid-state imaging device and method for solid-state imaging device for transferring charge from a photoelectric conversion portion to a floating diffusionMINOWA MASAAKI·Filed 2011·Granted Aug 26, 2014·1 cites·29 claims
- 2054US2018278865A1Method for driving imaging apparatusCANON KK·Filed 2018·Application pending·0 cites
- 2152US2020280690A1Method for driving imaging apparatusCANON KK·Filed 2020·Application pending·0 cites
- 2242US9930273B2Image pickup apparatus, image pickup system, and control method for the image pickup apparatus for controlling transfer switchesCANON KK·Filed 2016·Granted Mar 27, 2018·0 cites·17 claims
- 2341US10091449B2Imaging device and imaging system capable of performing a global electronic shutter operationCANON KK·Filed 2016·Granted Oct 2, 2018·0 cites·16 claims
- 2437US9716011B2Method of manufacturing semiconductor device and apparatus for manufacturing semiconductor deviceCANON KK·Filed 2015·Granted Jul 25, 2017·0 cites·14 claims
- 2536US2016099268A1Imaging apparatus and imaging systemCANON KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →