Inventor · disambiguated record
Mariko Mizuo
Also filed as: MIZUO MARIKO
2 granted patents·16 citations·filing 2000–2003
58Inventor score
Technology areasG01N
Top patents by PatentIndex Score
2 records- 0167US6528334B1Semiconductor inspection system, and method of manufacturing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Mar 4, 2003·10 cites·9 claims
- 0262US7023541B2Device inspecting for defect on semiconductor wafer surfaceRENESAS TECH CORP·Filed 2003·Granted Apr 4, 2006·6 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →