Inventor · disambiguated record
Masashi Mizuta
Also filed as: MIZUTA MASASHI
9 granted patents·2 pending applications·606 citations·filing 1986–2018
89Inventor score
Top patents by PatentIndex Score
11 records- 0196US6252261B1GaN crystal film, a group III element nitride semiconductor wafer and a manufacturing process thereforNEC CORP·Filed 1999·Granted Jun 26, 2001·319 cites·61 claims
- 0294US6100571AFet having non-overlapping field control electrode between gate and drainNEC CORP·Filed 1999·Granted Aug 8, 2000·151 cites·20 claims
- 0391US6483135B1Field effect transistorNEC COMPOUND SEMICONDUCTOR·Filed 1999·Granted Nov 19, 2002·93 cites·21 claims
- 0465US5877510ASpin polarized electron semiconductor source and apparatus utilizing the sameNEC CORP·Filed 1997·Granted Mar 2, 1999·23 cites·19 claims
- 0552US4780769ARecording and reproducing apparatus for time compressed video signals wherein said signals are expanded and converted into two separate channels before recordingSONY CORP·Filed 1986·Granted Oct 25, 1988·14 cites·4 claims
- 0643US10741380B2Method for washing semiconductor manufacturing apparatus component, apparatus for washing semiconductor manufacturing apparatus component, and vapor phase growth apparatusFURUKAWA CO LTD·Filed 2018·Granted Aug 11, 2020·0 cites·19 claims
- 0736US2003006437A1Field effect transistorNEC CORP·Filed 2002·Application pending·0 cites
- 0832US9273396B2Vapor deposition apparatus and method associatedMIZUTA MASASHI·Filed 2012·Granted Mar 1, 2016·0 cites·12 claims
- 0932US5231497AMethod of interpolating one video image field to create an interlaced image fieldSONY CORP·Filed 1991·Granted Jul 27, 1993·3 cites·1 claims
- 1032US5159442AColor signal processing apparatusSONY CORP·Filed 1990·Granted Oct 27, 1992·3 cites·4 claims
- 1130US2014144381A1Method for washing semiconductor manufacturing apparatus component, apparatus for washing semiconductor manufacturing apparatus component, and vapor phase growth apparatusMIZUTA MASASHI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →