Inventor · disambiguated record
Mansour Moinpour
Also filed as: MOINPOUR MANSOUR
20 granted patents·10 pending applications·349 citations·filing 1995–2023
95Inventor score
Top patents by PatentIndex Score
30 records- 0192US7383723B2Detecting particle agglomeration in chemical mechanical polishing slurriesINTEL CORP·Filed 2005·Granted Jun 10, 2008·22 cites·24 claims
- 0288US5861066AMethod and apparatus for cleaning edges of contaminated substratesONTRAK SYSTEMS INC·Filed 1996·Granted Jan 19, 1999·88 cites·18 claims
- 0384US7469443B2Brush for cleaning waferINTEL CORP·Filed 2005·Granted Dec 30, 2008·11 cites·4 claims
- 0484US6875086B2Surface planarizationINTEL CORP·Filed 2003·Granted Apr 5, 2005·26 cites·13 claims
- 0584US6334229B1Apparatus for cleaning edges of contaminated substratesLAM RES CORP·Filed 1999·Granted Jan 1, 2002·63 cites·31 claims
- 0683US6976907B2Polishing pad conditioningINTEL CORP·Filed 2003·Granted Dec 20, 2005·29 cites·33 claims
- 0781US7365375B2Organic-framework zeolite interlayer dielectricsINTEL CORP·Filed 2005·Granted Apr 29, 2008·10 cites·11 claims
- 0878US7048610B1Conditioning polishing pad for chemical-mechanical polishingINTEL CORP·Filed 2005·Granted May 23, 2006·10 cites·30 claims
- 0971US5883436AContact and via fabrication technologiesINTEL CORP·Filed 1997·Granted Mar 16, 1999·37 cites·14 claims
- 1064US12497694B2Method of forming low-resistivity Ru ALD through a bi-layer process and related structuresUNIV CALIFORNIA·Filed 2022·Granted Dec 16, 2025·0 cites·19 claims
- 1163US7704895B2Deposition method for high-k dielectric materialsINTEL CORP·Filed 2008·Granted Apr 27, 2010·1 cites·10 claims
- 1260US7048434B2Thermal analysis and characterization of layers and multiple layer structuresINTEL CORP·Filed 2002·Granted May 23, 2006·6 cites·19 claims
- 1359US7405419B2Unidirectionally conductive materials for interconnectionINTEL CORP·Filed 2005·Granted Jul 29, 2008·1 cites·13 claims
- 1457US7125321B2Multi-platen multi-slurry chemical mechanical polishing processINTEL CORP·Filed 2004·Granted Oct 24, 2006·7 cites·16 claims
- 1555US2023402290A1Atomic layer etching of metal oxides using novel co-reactants as halogenating agents for semiconductor fabricationMERCK PATENT GMBH·Filed 2023·Application pending·0 cites
- 1654US7084053B2Unidirectionally conductive materials for interconnectionINTEL CORP·Filed 2003·Granted Aug 1, 2006·5 cites·8 claims
- 1754US6495470B2Contact and via fabrication technologiesINTEL CORP·Filed 1995·Granted Dec 17, 2002·18 cites·21 claims
- 1852US7470450B2Forming a silicon nitride filmINTEL CORP·Filed 2004·Granted Dec 30, 2008·3 cites·3 claims
- 1951US12180583B2Methods of forming low resistivity titanium nitride thin film in horizontal vias and related devicesUNIV CALIFORNIA·Filed 2022·Granted Dec 31, 2024·0 cites·20 claims
- 2051US2025109501A1Atomic layer etching of metals using novel co-reactants as halogenating agentsMERCK PATENT GMBH·Filed 2023·Application pending·0 cites
- 2150US2023420244A1Method of manufacturing silicon nitrogeneous filmMERCK PATENT GMBH·Filed 2021·Application pending·0 cites
- 2241US2007251157A1Pre-coated particles for chemical mechanical polishingGOLZARIAN REZA M·Filed 2007·Application pending·0 cites
- 2340US2006220251A1Reducing internal film stress in dielectric filmKLOSTER GRANT·Filed 2005·Application pending·0 cites
- 2439US2003207661A1Annealing of CMP polishing padsFiled 2002·Application pending·0 cites
- 2538US2005287032A1Anti-bacterial protection to improve performance of post CMP clean brushTREGUB ALEXANDER·Filed 2004·Application pending·0 cites
- 2637US6365521B1Passivation for tight metal geometryINTEL CORP·Filed 1997·Granted Apr 2, 2002·12 cites·13 claims
- 2737US2021398848A1Method for deposition of highly selective metal filmsMERCK PATENT GMBH·Filed 2019·Application pending·0 cites
- 2836US2007123059A1Methods of internal stress reduction in dielectric films with chemical incorporation and structures formed therebyHAVERTY MICHAEL G·Filed 2005·Application pending·0 cites
- 2934US7229484B2Pre-coated particles for chemical mechanical polishingINTEL CORP·Filed 2002·Granted Jun 12, 2007·0 cites·11 claims
- 3034US2004040575A1Brush for cleaning/scrubbing a substrateFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →