Inventor · disambiguated record
Masaya Muranaka
Also filed as: MURANAKA MASAYA
28 granted patents·1,146 citations·filing 1987–2007
98Inventor score
Top patents by PatentIndex Score
28 records- 0197US6735726B2Method of deciding error rate and semiconductor integrated circuit deviceHITACHI LTD·Filed 2001·Granted May 11, 2004·165 cites·11 claims
- 0295US7665049B2Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chipHITACHI LTD·Filed 2007·Granted Feb 16, 2010·31 cites·14 claims
- 0395US7282377B2Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chipHITACHI ULSI SYS CO LTD·Filed 2005·Granted Oct 16, 2007·30 cites·21 claims
- 0495US7249289B2Method of deciding error rate and semiconductor integrated circuit deviceELPIDA MEMORY INC·Filed 2004·Granted Jul 24, 2007·93 cites·4 claims
- 0593US5021998ASemiconductor memory device with low-house pads for electron beam testHITACHI LTD·Filed 1989·Granted Jun 4, 1991·88 cites·15 claims
- 0692US6941536B2Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chipHITACHI ULSI SYS CO LTD·Filed 2001·Granted Sep 6, 2005·58 cites·21 claims
- 0792US5969996ASemiconductor memory device and memory systemHIACHI LTD·Filed 1998·Granted Oct 19, 1999·80 cites·43 claims
- 0888US6577530B2Semiconductor memory device having memory cells each capable of storing three or more valuesHITACHI LTD·Filed 2001·Granted Jun 10, 2003·49 cites·17 claims
- 0987US5485425ASemiconductor memory device having redundant column and operation method thereofHITACHI LTD·Filed 1995·Granted Jan 16, 1996·70 cites·15 claims
- 1084US5287000AResin-encapsulated semiconductor memory device useful for single in-line packagesHITACHI LTD·Filed 1991·Granted Feb 15, 1994·89 cites·11 claims
- 1183US4807190ASemiconductor integrated circuit deviceHITACHI LTD·Filed 1987·Granted Feb 21, 1989·32 cites·46 claims
- 1282US6823485B1Semiconductor storage device and test systemHITACHI LTD·Filed 1998·Granted Nov 23, 2004·48 cites·14 claims
- 1380US5818784ASemiconductor memory device and memory systemHITACHI LTD·Filed 1996·Granted Oct 6, 1998·33 cites·6 claims
- 1478US4934820ASemiconductor deviceHITACHI LTD·Filed 1988·Granted Jun 19, 1990·52 cites·10 claims
- 1576US5301142ASemiconductor memoryHITACHI LTD·Filed 1992·Granted Apr 5, 1994·36 cites·23 claims
- 1673US6064605ASemiconductor memory device and memory systemHITACHI LTD·Filed 1999·Granted May 16, 2000·23 cites·1 claims
- 1772US5596537ASemiconductor device test circuit having test enable circuitry and test mode-entry circuitryTEXAS INSTRUMENTS INC·Filed 1994·Granted Jan 21, 1997·35 cites·7 claims
- 1869US6633508B2Semiconductor memory device and memory systemHITACHI LTD·Filed 2001·Granted Oct 14, 2003·11 cites·20 claims
- 1967US5598373ASemiconductor memory systemHITACHI LTD·Filed 1995·Granted Jan 28, 1997·29 cites·8 claims
- 2066US7702704B2Random number generating method and semiconductor integrated circuit deviceHITACHI ULSI SYS CO LTD·Filed 2004·Granted Apr 20, 2010·10 cites·18 claims
- 2163US5426613ASemiconductor memory device with improved substrate arrangement to permit forming a plurality of different types of random access memory, and a testing method thereforHITACHI LTD·Filed 1992·Granted Jun 20, 1995·18 cites·7 claims
- 2258US5805513ASemiconductor memory device with improved substrate arrangement to permit forming a plurality of different types of random access memory, and a testing method thereforHITACHI LTD·Filed 1995·Granted Sep 8, 1998·15 cites·8 claims
- 2354US7167536B2Signal receiving circuit, semiconductor device and systemELPIDA MEMORY INC·Filed 2002·Granted Jan 23, 2007·2 cites·23 claims
- 2452US5726994AAddress multiplex semiconductor memory device for enabling testing of the entire circuit or for only partial components thereofHITACHI LTD·Filed 1996·Granted Mar 10, 1998·16 cites·6 claims
- 2551US6282141B1Semiconductor memory device and memory systemHITACHI LTD·Filed 2000·Granted Aug 28, 2001·4 cites·11 claims
- 2650US5217917ASemiconductor memory device with improved substrate arrangement to permit forming a plurality of different types of random access memory, and a testing method thereforHITACHI LTD·Filed 1990·Granted Jun 8, 1993·11 cites·20 claims
- 2747US4849939ASemiconductor memorizing deviceHITACHI LTD·Filed 1987·Granted Jul 18, 1989·12 cites·23 claims
- 2834US5151772ASemiconductor integrated circuit deviceHITACHI LTD·Filed 1990·Granted Sep 29, 1992·6 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →