Inventor · disambiguated record
Mathias N. M. Muris
Also filed as: MURIS MATHIAS N M
8 granted patents·89 citations·filing 1991–2003
87Inventor score
Top patents by PatentIndex Score
8 records- 0156US6807505B2Circuit with interconnect test unitKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Oct 19, 2004·7 cites·9 claims
- 0256US5097151ASequential finite-state machine circuit and integrated circuitPHILIPS CORP·Filed 1991·Granted Mar 17, 1992·21 cites·6 claims
- 0353US5781559ATestable circuitPHILIPS CORP·Filed 1996·Granted Jul 14, 1998·18 cites·15 claims
- 0450US6297643B2Connection test methodPHILIPS CORP·Filed 1999·Granted Oct 2, 2001·15 cites·11 claims
- 0540US6622108B1Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuitKONINKL PHILIPS ELECTRONICS NV·Filed 1999·Granted Sep 16, 2003·7 cites·13 claims
- 0638US6119256AApparatus for testing a fixed logic value interconnection between integrated circuitsPHILIPS CORP·Filed 1994·Granted Sep 12, 2000·8 cites·17 claims
- 0736US5978945ATester arrangement comprising a connection module for testing, by way of the boundary scan test method, a carrier provided with a first number of digital ICS with BST logic and a second number of digital ICS without BST logicPHILIPS CORP·Filed 1994·Granted Nov 2, 1999·7 cites·16 claims
- 0832US5636229AMethod for generating test patterns to detect an electric shortcircuit, a method for testing electric circuitry while using test patterns so generated, and a tester device for testing electric circuitry with such test patternsPHILIPS CORP·Filed 1992·Granted Jun 3, 1997·6 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →