Inventor · disambiguated record
Marc R. Mydill
Also filed as: MYDILL MARC · MYDILL MARC R
9 granted patents·1 pending application·312 citations·filing 1987–2016
90Inventor score
Top patents by PatentIndex Score
10 records- 0190US6574760B1Testing method and apparatus assuring semiconductor device quality and reliabilityTEXAS INSTRUMENTS INC·Filed 1999·Granted Jun 3, 2003·91 cites·19 claims
- 0288US5025205AReconfigurable architecture for logic test systemTEXAS INSTRUMENTS INC·Filed 1989·Granted Jun 18, 1991·97 cites·31 claims
- 0381US6243841B1Automated test and evaluation sampling system and methodTEXAS INSTRUMENTS INC·Filed 1998·Granted Jun 5, 2001·53 cites·22 claims
- 0469US4870346ADistributed pseudo random sequence control with universal polynomial function generator for LSI/VLSI test systemsTEXAS INSTRUMENTS INC·Filed 1987·Granted Sep 26, 1989·25 cites·22 claims
- 0568US5151903AHigh efficiency pattern sequence controller for automatic test equipmentTEXAS INSTRUMENTS INC·Filed 1989·Granted Sep 29, 1992·25 cites·12 claims
- 0645US5471145ACalibrating transition dependent timing errors in automatic test equipment using a precise pulse width generatorTEXAS INSTRUMENTS INC·Filed 1994·Granted Nov 28, 1995·11 cites·5 claims
- 0737US5265101AFunction array sequencing for VLSI test systemTEXAS INSTRUMENTS INC·Filed 1989·Granted Nov 23, 1993·6 cites·5 claims
- 0835US2016245864A1Automatic test apparatus for functional digital testing of multiple semiconductor integrated circuit devicesTEXAS TEST CORP·Filed 2016·Application pending·0 cites
- 0932US4855969ADynamic timing reference alignment systemTEXAS INSTRUMENTS INC·Filed 1987·Granted Aug 8, 1989·3 cites·17 claims
- 1028US5028878ADual memory timing system for VLSI test systemsTEXAS INSTRUMENTS INC·Filed 1989·Granted Jul 2, 1991·1 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →