Inventor · disambiguated record
Masahiko Nagao
Also filed as: NAGAO MASAHIKO
7 granted patents·1 pending application·57 citations·filing 1999–2009
83Inventor score
Top patents by PatentIndex Score
8 records- 0177US6987894B2Appearance inspection apparatus and method in which plural threads are processed in parallelNEC ELECTRONICS CORP·Filed 2001·Granted Jan 17, 2006·22 cites·8 claims
- 0276US6954274B2Method of inspecting semiconductor integrated circuit which can quickly measure a cubic bodyNEC ELECTRONICS CORP·Filed 2002·Granted Oct 11, 2005·15 cites·20 claims
- 0367US7664306B2Visual inspection method and visual inspection apparatusNEC ELECTRONICS CORP·Filed 2009·Granted Feb 16, 2010·1 cites·10 claims
- 0453US6950549B2Visual inspection method and visual inspection apparatusNEC ELECTRONICS CORP·Filed 2002·Granted Sep 27, 2005·4 cites·8 claims
- 0548US6741734B2Appearance inspection method and appearance inspection apparatus having high inspection processing speedNEC CORP·Filed 2001·Granted May 25, 2004·3 cites·21 claims
- 0645US7545970B2Visual inspection method and visual inspection apparatusNEC ELECTRONICS CORP·Filed 2005·Granted Jun 9, 2009·0 cites·6 claims
- 0737US2003228066A1Image data processing unit for use in a visual inspection deviceNEC CORP·Filed 2003·Application pending·0 cites
- 0833US6597805B1Visual inspection method for electronic device, visual inspecting apparatus for electronic device, and record medium for recording program which causes computer to perform visual inspecting method for electronic deviceNEC CORP·Filed 1999·Granted Jul 22, 2003·12 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →