Inventor · disambiguated record
Mark Michael Nelson
Also filed as: NELSON MARK · NELSON MARK M · NELSON MARK MICHAEL
9 granted patents·1 pending application·157 citations·filing 1996–2023
89Inventor score
Files withAMI SEMICONDUCTOR INC3AMERICAN MICRO SYST2WAFERSCALE INTEGRATION INC2SALMAN EMAD1SCOTT GREGORY JAMES1
Top patents by PatentIndex Score
10 records- 0187US8645341B2Method and system for automatically updating a software QA test repositorySALMAN EMAD·Filed 2010·Granted Feb 4, 2014·35 cites·51 claims
- 0285US8394700B2Device including memory array and method thereofSCOTT GREGORY JAMES·Filed 2010·Granted Mar 12, 2013·12 cites·20 claims
- 0379US5683925AManufacturing method for ROM array with minimal band-to-band tunnelingWAFERSCALE INTEGRATION INC·Filed 1996·Granted Nov 4, 1997·62 cites·9 claims
- 0470US6960529B1Methods for sidewall protection of metal interconnect for unlanded vias using physical vapor depositionAMI SEMICONDUCTOR INC·Filed 2003·Granted Nov 1, 2005·23 cites·15 claims
- 0554US2025031586A1Carbon film integrated into a back end of line processSKYWATER TECH FOUNDRY INC·Filed 2023·Application pending·0 cites
- 0647US7141503B2Methods for manufacturing a soft error and defect resistant pre-metal dielectric layerAMI SEMICONDUCTOR INC·Filed 2004·Granted Nov 28, 2006·2 cites·36 claims
- 0747US6794691B2Use of irregularly shaped conductive filler features to improve planarization of the conductive layer while reducing parasitic capacitance introduced by the filler featuresAMI SEMICONDUCTOR INC·Filed 2003·Granted Sep 21, 2004·3 cites·53 claims
- 0846US6265729B1Method for detecting and characterizing plasma-etch induced damage in an integrated circuitAMERICAN MICRO SYST·Filed 1999·Granted Jul 24, 2001·11 cites·19 claims
- 0935US6271539B1Electrical diagnostic technique for silicon plasma-etch induced damage characterizationAMERICAN MICRO SYST·Filed 1997·Granted Aug 7, 2001·5 cites·18 claims
- 1033US5838046AOperating method for ROM array which minimizes band-to-band tunnelingWAFERSCALE INTEGRATION INC·Filed 1996·Granted Nov 17, 1998·4 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →