Inventor · disambiguated record
Masahiko Nikaidou
Also filed as: NIKAIDOU MASAHIKO
5 granted patents·280 citations·filing 1998–2003
82Inventor score
Files withNEC CORP5
Top patents by PatentIndex Score
5 records- 0196US6400168B2Method for fabricating probe tip portion composed by coaxial cableNEC CORP·Filed 2001·Granted Jun 4, 2002·116 cites·6 claims
- 0293US6281691B1Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cableNEC CORP·Filed 1999·Granted Aug 28, 2001·119 cites·22 claims
- 0375US6242930B1High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachableNEC CORP·Filed 1998·Granted Jun 5, 2001·41 cites·23 claims
- 0437US6807000B2Gain measurement device for optical amplifier and method thereofNEC CORP·Filed 2003·Granted Oct 19, 2004·0 cites·11 claims
- 0533US6229321B1Process for manufacturing high frequency multichip module enabling independent test of bare chipNEC CORP·Filed 1999·Granted May 8, 2001·4 cites·9 claims
Join the waitlist — get patent alerts
Get an alert when Masahiko Nikaidou files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →