Inventor · disambiguated record
Masako Nishimura
Also filed as: NISHIMURA MASAKO
10 granted patents·2 pending applications·59 citations·filing 2005–2016
86Inventor score
Top patents by PatentIndex Score
12 records- 0184USD778920SDisplay screen with graphical user interfaceHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 14, 2017·31 cites·1 claims
- 0271US10020163B2Charged particle beam apparatus, specimen observation system and operation programHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 10, 2018·1 cites·18 claims
- 0366US9443694B2Charged particle beam apparatus, specimen observation system and operation programHITACHI HIGH TECH CORP·Filed 2013·Granted Sep 13, 2016·1 cites·25 claims
- 0466US9086343B2Methods for observing samples and preprocessing thereofHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 21, 2015·2 cites·13 claims
- 0560USD774046SDisplay screen with graphical user interfaceHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 13, 2016·11 cites·1 claims
- 0652USD774045SDisplay screen with graphical user interfaceHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 13, 2016·8 cites·1 claims
- 0746US9741526B2Charged particle beam apparatus and sample image acquiring methodHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 22, 2017·0 cites·6 claims
- 0845USD774074SDisplay screen with graphical user interfaceHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 13, 2016·5 cites·1 claims
- 0944US2006011834A1Low vacuum scanning electron microscopeNISHIMURA MASAKO·Filed 2005·Application pending·0 cites
- 1042US8698079B2Method for scanning electron microscope observation of sample floating on liquid surfaceSHIONO MASAMICHI·Filed 2011·Granted Apr 15, 2014·0 cites·6 claims
- 1139US9058957B2Charged particle beam apparatusSHIGETO KUNJI·Filed 2012·Granted Jun 16, 2015·0 cites·8 claims
- 1225US2012326033A1Method for superimposing and displaying electron microscope image and optical imageSHIONO MASAMICHI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →