Inventor · disambiguated record
Masanobu Ohashi
Also filed as: OHASHI MASANOBU
2 granted patents·4 citations·filing 2008–2021
40Inventor score
Top patents by PatentIndex Score
2 records- 0157US7701237B2Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device, and probe card used for burn-in stress and D/S testsTOSHIBA KK·Filed 2008·Granted Apr 20, 2010·4 cites·10 claims
- 0243US12492096B2Paper folding deviceDUPLO SEIKO CORP·Filed 2021·Granted Dec 9, 2025·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →