Inventor · disambiguated record
Martin Perner
Also filed as: PERNER MARTIN
35 granted patents·2 pending applications·449 citations·filing 2001–2021
97Inventor score
Top patents by PatentIndex Score
37 records- 0198US6590816B2Integrated memory and method for testing and repairing the integrated memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jul 8, 2003·176 cites·17 claims
- 0290US11742048B2Method for testing memoryINFINEON TECHNOLOGIES AG·Filed 2021·Granted Aug 29, 2023·2 cites·19 claims
- 0390US6731552B2Integrated dynamic memory and operating methodINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 4, 2004·56 cites·18 claims
- 0484US6940774B2Integrated dynamic memory and operating methodINFINEON TECHNOLOGIES AG·Filed 2003·Granted Sep 6, 2005·35 cites·20 claims
- 0583US7403440B2Electronic memory apparatus and method for operating an electronic memory apparatusINFINEON TECHNOLOGIES AG·Filed 2006·Granted Jul 22, 2008·15 cites·24 claims
- 0681US7330378B2Inputting and outputting operating parameters for an integrated semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 12, 2008·15 cites·12 claims
- 0777US6694282B2Method and device for determining an operating temperature of a semiconductor componentINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 17, 2004·25 cites·12 claims
- 0874US10395729B2Method of operating a memory unit sectorINFINEON TECHNOLOGIES AG·Filed 2018·Granted Aug 27, 2019·2 cites·20 claims
- 0974US7202545B2Memory module and method for operating a memory moduleINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 10, 2007·21 cites·14 claims
- 1068US7203106B2Integrated semiconductor memory with redundant memory cellsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 10, 2007·7 cites·25 claims
- 1166US7286427B2Integrated semiconductor memory device with test circuit for sense amplifierINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 23, 2007·6 cites·17 claims
- 1266US7249301B2Semiconductor circuit and method for testing, monitoring and application-near setting of a semiconductor circuitINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 24, 2007·14 cites·34 claims
- 1365US7349253B2Memory device and method for testing memory devices with repairable redundancyINFINEON TECHNOLOGIES AG·Filed 2006·Granted Mar 25, 2008·6 cites·25 claims
- 1465US6847669B2Sheet-like electrooptical component, light-guide configuration for serial, bidirectional signal transmission and optical printed circuit boardINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jan 25, 2005·8 cites·19 claims
- 1564US11238948B2Testing memory cells by allocating an access value to a memory access and granting an access creditINFINEON TECHNOLOGIES AG·Filed 2021·Granted Feb 1, 2022·0 cites·12 claims
- 1662US9941000B2Memory unit and method of operating a memory unit sectorINFINEON TECHNOLOGIES AG·Filed 2016·Granted Apr 10, 2018·1 cites·20 claims
- 1762US6992475B2Circuit and method for determining at least one voltage, current and/or power value for an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 31, 2006·9 cites·14 claims
- 1861US7184339B2Semi-conductor component, as well as a process for the in-or output of test dataINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 27, 2007·5 cites·10 claims
- 1960US7248530B2Integrated semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 24, 2007·4 cites·15 claims
- 2056US7385837B2Nonvolatile memory cell and methods for operating a nonvolatile memory cellINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 10, 2008·3 cites·22 claims
- 2155US7057961B2Circuit and method for evaluating and controlling a refresh rate of memory cells of a dynamic memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 6, 2006·8 cites·17 claims
- 2255US6999369B2Circuit and method for refreshing memory cells of a dynamic memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Feb 14, 2006·8 cites·19 claims
- 2352US7123533B2Circuit and method for refreshing memory cells of a dynamic memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Oct 17, 2006·7 cites·17 claims
- 2452US6856721B2Light guide configuration for serial bi-directional signal transmission, optical circuit board, and fabrication methodINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 15, 2005·3 cites·25 claims
- 2551US10083743B2Memory unit and method of operating a memory unit sectorINFINEON TECHNOLOGIES AG·Filed 2018·Granted Sep 25, 2018·0 cites·20 claims
- 2650US10916322B2Testing memory cells by allocating an access value to a memory access and granting an access creditINFINEON TECHNOLOGIES AG·Filed 2018·Granted Feb 9, 2021·0 cites·10 claims
- 2750US7313732B2Memory arrangement in a computer systemINFINEON TECHNOLOGIES AG·Filed 2004·Granted Dec 25, 2007·1 cites·22 claims
- 2849US7082513B2Integrated memory and method for checking the functioning of an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 25, 2006·6 cites·15 claims
- 2944US7009417B2Semiconductor module and methods for functionally testing and configuring a semiconductor moduleINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 7, 2006·4 cites·29 claims
- 3040US7778090B2Buffer circuit for a memory moduleQIMONDA AG·Filed 2007·Granted Aug 17, 2010·0 cites·39 claims
- 3140US7057201B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 6, 2006·2 cites·19 claims
- 3236US7337284B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 26, 2008·0 cites·29 claims
- 3334US7071676B2Circuit configuration and method for measuring at least one operating parameter for an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 4, 2006·0 cites·19 claims
- 3433US6882584B2Method for operating a semiconductor memory, and semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 19, 2005·0 cites·29 claims
- 3533US2016364280A1Circuitry and method for testing an error-correction capabilityINFINEON TECHNOLOGIES AG·Filed 2016·Application pending·0 cites
- 3632US6996187B2Method and apparatus for data transmissionINFINEON TECHNOLOGIES AG·Filed 2001·Granted Feb 7, 2006·0 cites·18 claims
- 3732US2004057307A1Self-test circuit and a method for testing a memory with the self-test circuitFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →