Inventor · disambiguated record
Mario Pita
Also filed as: PITA MARIO · PITA MARIO V
6 granted patents·4 pending applications·67 citations·filing 1999–2006
82Inventor score
Top patents by PatentIndex Score
10 records- 0173US6566269B1Removal of post etch residuals on wafer surfaceLUCENT TECHNOLOGIES INC·Filed 2000·Granted May 20, 2003·25 cites·20 claims
- 0256US7087498B2Method for controlling trench depth in shallow trench isolation featuresAGERE SYSTEMS INC·Filed 2003·Granted Aug 8, 2006·7 cites·22 claims
- 0351US6406999B1Semiconductor device having reduced line width variations between tightly spaced and isolated featuresAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jun 18, 2002·17 cites·15 claims
- 0448US6395639B1Process for improving line width variations between tightly spaced and isolated features in integrated circuitsAGERE SYST GUARDIAN CORP·Filed 1999·Granted May 28, 2002·15 cites·22 claims
- 0542US2007161173A1Process to integrate fabrication of bipolar devices into a CMOS process flowKERR DANIEL C·Filed 2006·Application pending·0 cites
- 0639US2007069295A1Process to integrate fabrication of bipolar devices into a CMOS process flowKERR DANIEL C·Filed 2005·Application pending·0 cites
- 0737US7700491B2Stringer elimination in a BiCMOS processAGERE SYSTEMS INC·Filed 2005·Granted Apr 20, 2010·0 cites·12 claims
- 0835US2003228755A1Method for metal patterning and improved linewidth controlFiled 2002·Application pending·0 cites
- 0934US2005066994A1Methods for cleaning processing chambersFiled 2003·Application pending·0 cites
- 1028US6136615AMigration from control wafer to product wafer particle checksLUCENT TECHNOLOGIES INC·Filed 1999·Granted Oct 24, 2000·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →