Inventor · disambiguated record
Manfred Proell
Also filed as: PROELL MANFRED
13 granted patents·10 pending applications·49 citations·filing 2002–2007
88Inventor score
Top patents by PatentIndex Score
23 records- 0174US7877649B2Method and apparatus for testing a memory chip using a common node for multiple inputs and outputsQIMONDA AG·Filed 2007·Granted Jan 25, 2011·10 cites·5 claims
- 0268US7206238B2Integrated semiconductor memory comprising at least one word line and methodINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 17, 2007·7 cites·16 claims
- 0366US6914837B2DRAM memory with a shared sense amplifier structureINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 5, 2005·15 cites·20 claims
- 0449US6906972B2Integrated DRAM semiconductor memory and method for operating the sameINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 14, 2005·6 cites·14 claims
- 0546US7512023B2Memory and method for improving the reliability of a memory having a used memory region and an unused memory regionQIMONDA AG·Filed 2006·Granted Mar 31, 2009·1 cites·10 claims
- 0641US7120074B2Semiconductor memory and method for operating a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Oct 10, 2006·3 cites·25 claims
- 0739US7110310B2RAM store and control method thereforINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 19, 2006·2 cites·17 claims
- 0839US2006192085A1Semiconductor circuit and arrangement and method for monitoring fuses of a semiconductor circuitEGGERS GEORG E·Filed 2006·Application pending·0 cites
- 0938US7752510B2Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unitQIMONDA AG·Filed 2007·Granted Jul 6, 2010·0 cites·5 claims
- 1038US7039838B2Method for testing a circuit unit to be tested and test apparatusINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 2, 2006·2 cites·14 claims
- 1138US6970389B2Integrated memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 29, 2005·2 cites·4 claims
- 1237US7710810B2Device for refreshing memory contentsQIMONDA AG·Filed 2007·Granted May 4, 2010·0 cites·27 claims
- 1336US6965535B2Integrated semiconductor memory circuit and a method for operating the sameINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 15, 2005·1 cites·16 claims
- 1436US2008080265A1Semiconductor memory and method for testing semiconductor memoriesQIMONDA AG·Filed 2007·Application pending·0 cites
- 1535US2008219060A1Device and method for internal voltage monitoringQIMONDA AG·Filed 2007·Application pending·0 cites
- 1634US2007253264A1Integrated Semiconductor Memory with a Test Function and Method for Testing an Integrated Semiconductor MemoryPROELL MANFRED·Filed 2007·Application pending·0 cites
- 1733US2005280036A1Semiconductor product having a first and at least one further semiconductor circuit and methodSCHROEDER STEPHAN·Filed 2005·Application pending·0 cites
- 1833US2007258307A1Memory circuit and method for refreshing dynamic memory cellsPROELL MANFRED·Filed 2007·Application pending·0 cites
- 1933US2007260955A1Test auxiliary device in a memory moduleKLIEWER JOERG·Filed 2007·Application pending·0 cites
- 2033US2007070758A1Semiconductor memory with sense amplifier and switchQIMONDA AG·Filed 2006·Application pending·0 cites
- 2133US2007047355A1Method for detecting a leakage current of a semiconductor memoryQIMONDA AG·Filed 2006·Application pending·0 cites
- 2232US7248536B2Integrated semiconductor memory and method for operating an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 24, 2007·0 cites·25 claims
- 2331US2006056241A1Artificial aging of chips with memoriesAUGE JUERGEN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →