Inventor · disambiguated record
Matthew C. Putman
Also filed as: PUTMAN MATTHEW · PUTMAN MATTHEW C
104 granted patents·17 pending applications·406 citations·filing 2001–2025
99Inventor score
Files withNANOTRONICS IMAGING INC106PUTMAN MATTHEW C7NANOTRONICS HEALTH LLC4TECH PRO INC2PUTMAN JOHN B1
Top patents by PatentIndex Score
121 records- 0198US11675330B2System and method for improving assembly line processesNANOTRONICS IMAGING INC·Filed 2021·Granted Jun 13, 2023·12 cites·20 claims
- 0298US11209795B2Assembly error correction for assembly linesNANOTRONICS IMAGING INC·Filed 2020·Granted Dec 28, 2021·17 cites·20 claims
- 0398US10481579B1Dynamic training for assembly linesNANOTRONICS IMAGING INC·Filed 2019·Granted Nov 19, 2019·66 cites·20 claims
- 0497US12153411B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2023·Granted Nov 26, 2024·2 cites·20 claims
- 0597US11156992B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2019·Granted Oct 26, 2021·15 cites·13 claims
- 0697US11086988B1Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2020·Granted Aug 10, 2021·8 cites·20 claims
- 0797US10169852B1Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imagingNANOTRONICS IMAGING INC·Filed 2018·Granted Jan 1, 2019·29 cites·18 claims
- 0897US10146041B1Systems, devices and methods for automatic microscope focusNANOTRONICS IMAGING INC·Filed 2018·Granted Dec 4, 2018·23 cites·20 claims
- 0997US10048477B1Camera and specimen alignment to facilitate large area imaging in microscopyNANOTRONICS IMAGING INC·Filed 2017·Granted Aug 14, 2018·30 cites·17 claims
- 1096US11703824B2Assembly error correction for assembly linesNANOTRONICS IMAGING INC·Filed 2021·Granted Jul 18, 2023·7 cites·20 claims
- 1196US11156991B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2019·Granted Oct 26, 2021·12 cites·20 claims
- 1296US11084225B2Systems, methods, and media for artificial intelligence process control in additive manufacturingNANOTRONICS IMAGING INC·Filed 2020·Granted Aug 10, 2021·7 cites·18 claims
- 1396US10970831B2Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imagingNANOTRONICS IMAGING INC·Filed 2020·Granted Apr 6, 2021·4 cites·20 claims
- 1496US10247910B1Systems, devices and methods for automatic microscopic focusNANOTRONICS IMAGING INC·Filed 2018·Granted Apr 2, 2019·18 cites·32 claims
- 1595US11156982B2Dynamic training for assembly linesNANOTRONICS IMAGING INC·Filed 2019·Granted Oct 26, 2021·16 cites·20 claims
- 1694US11815673B2Method and system for mapping objects on unknown specimensNANOTRONICS IMAGING INC·Filed 2022·Granted Nov 14, 2023·2 cites·17 claims
- 1794US11672933B1Method and system for bi-level treatment of sleep apneaNANOTRONICS HEALTH LLC·Filed 2022·Granted Jun 13, 2023·3 cites·15 claims
- 1894US11662563B2Fluorescence microscopy inspection systems, apparatus and methods with darkfield channelNANOTRONICS IMAGING INC·Filed 2022·Granted May 30, 2023·2 cites·20 claims
- 1994US11117328B2Systems, methods, and media for manufacturing processesNANOTRONICS IMAGING INC·Filed 2020·Granted Sep 14, 2021·15 cites·20 claims
- 2094US10545096B1Marco inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2019·Granted Jan 28, 2020·7 cites·6 claims
- 2193US11411293B1Fault protected signal splitter apparatusNANOTRONICS IMAGING INC·Filed 2021·Granted Aug 9, 2022·2 cites·24 claims
- 2292US10481379B1Method and system for automatically mapping fluid objects on a substrateNANOTRONICS IMAGING INC·Filed 2018·Granted Nov 19, 2019·9 cites·19 claims
- 2391US11063965B1Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2020·Granted Jul 13, 2021·3 cites·19 claims
- 2491US10578850B1Fluorescence microscopy inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2019·Granted Mar 3, 2020·9 cites·19 claims
- 2590US12449792B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2024·Granted Oct 21, 2025·0 cites·20 claims
- 2690US12298489B2Fluorescence microscopy inspection systems, apparatus and methods with darkfield channelNANOTRONICS IMAGING INC·Filed 2023·Granted May 13, 2025·1 cites·20 claims
- 2790US12111923B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2023·Granted Oct 8, 2024·1 cites·20 claims
- 2890US11656429B2Systems, devices, and methods for automatic microscopic focusNANOTRONICS IMAGING INC·Filed 2022·Granted May 23, 2023·1 cites·20 claims
- 2990US11561383B2Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating theretoNANOTRONICS IMAGING INC·Filed 2021·Granted Jan 24, 2023·2 cites·20 claims
- 3089US10467740B1Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imagingNANOTRONICS IMAGING INC·Filed 2018·Granted Nov 5, 2019·4 cites·20 claims
- 3188US12153412B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2023·Granted Nov 26, 2024·0 cites·20 claims
- 3288US11100221B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2020·Granted Aug 24, 2021·2 cites·16 claims
- 3387US11416711B2Defect detection systemNANOTRONICS IMAGING INC·Filed 2021·Granted Aug 16, 2022·2 cites·14 claims
- 3486US11294162B2Fluorescence microscopy inspection systems, apparatus and methods with darkfield channelNANOTRONICS IMAGING INC·Filed 2020·Granted Apr 5, 2022·2 cites·20 claims
- 3585US11953863B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 9, 2024·0 cites·17 claims
- 3685US10915992B1System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2019·Granted Feb 9, 2021·3 cites·20 claims
- 3785US10518480B2Systems, methods, and media for artificial intelligence feedback control in additive manufacturingNANOTRONICS IMAGING INC·Filed 2018·Granted Dec 31, 2019·6 cites·21 claims
- 3885US6795172B2Method for preparing a cut surface in uncured rubber samples for measuring filter dispersionTECH PRO INC·Filed 2001·Granted Sep 21, 2004·35 cites·8 claims
- 3984US11947671B2Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 2, 2024·0 cites·20 claims
- 4084US11693956B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2021·Granted Jul 4, 2023·1 cites·20 claims
- 4183US12118089B2Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2024·Granted Oct 15, 2024·0 cites·20 claims
- 4283US11948270B2Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imagingNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 2, 2024·0 cites·20 claims
- 4383US2025147499A1Imitation Learning in a Manufacturing EnvironmentNANOTRONICS IMAGING INC·Filed 2024·Application pending·0 cites
- 4483US2025028819A1Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2024·Application pending·0 cites
- 4583US2025315017A1Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2025·Application pending·0 cites
- 4682US12174361B2Method and system for mapping objects on unknown specimensNANOTRONICS IMAGING INC·Filed 2023·Granted Dec 24, 2024·0 cites·20 claims
- 4782US10509199B2Systems, devices and methods for automatic microscopic focusNANOTRONICS IMAGING INC·Filed 2019·Granted Dec 17, 2019·2 cites·32 claims
- 4882US9488819B2Automatic microscopic focus system and method for analysis of transparent or low contrast specimensPUTMAN MATTHEW C·Filed 2012·Granted Nov 8, 2016·9 cites·14 claims
- 4981US12165353B2Systems, methods, and media for manufacturing processesNANOTRONICS IMAGING INC·Filed 2021·Granted Dec 10, 2024·1 cites·17 claims
- 5081US12153668B2Securing industrial production from sophisticated attacksNANOTRONICS IMAGING INC·Filed 2020·Granted Nov 26, 2024·1 cites·20 claims
Showing the top 50 of 121 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →