Inventor · disambiguated record
Markus B. Raschke
Also filed as: RASCHKE MARKUS · RASCHKE MARKUS B
6 granted patents·1 pending application·90 citations·filing 2008–2020
82Inventor score
Top patents by PatentIndex Score
7 records- 0196US8793811B1Method and apparatus for infrared scattering scanning near-field optical microscopyPRATER CRAIG·Filed 2013·Granted Jul 29, 2014·40 cites·31 claims
- 0292US8869602B2High frequency deflection measurement of IR absorptionBELKIN MIKHAIL·Filed 2011·Granted Oct 28, 2014·27 cites·30 claims
- 0390US8881311B2Method and apparatus of physical property measurement using a probe-based nano-localized light sourceBRUKER NANO INC·Filed 2014·Granted Nov 4, 2014·10 cites·20 claims
- 0479US7977636B2Infrared imaging using thermal radiation from a scanning probe tipANASYS INSTR INC·Filed 2008·Granted Jul 12, 2011·12 cites·19 claims
- 0566US9052336B2Method and apparatus of physical property measurement using a probe-based nano-localized light sourceBRUKER NANO INC·Filed 2014·Granted Jun 9, 2015·1 cites·12 claims
- 0655US2016033547A1Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light SourceBRUKER NANO INC·Filed 2015·Application pending·0 cites
- 0754US11994533B2Methods and systems for scanning probe sample property measurement and imagingUNIV COLORADO REGENTS·Filed 2020·Granted May 28, 2024·0 cites·46 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →