Inventor · disambiguated record
Mark C. Reuter
Also filed as: REUTER MARK C
10 granted patents·3 pending applications·6 citations·filing 2004–2019
81Inventor score
Top patents by PatentIndex Score
13 records- 0178US11299801B2Structure and method to fabricate highly reactive physical vapor deposition targetIBM·Filed 2019·Granted Apr 12, 2022·0 cites·20 claims
- 0275US8321961B2Production scale fabrication method for high resolution AFM tipsCOHEN GUY·Filed 2010·Granted Nov 27, 2012·2 cites·19 claims
- 0368US12334320B2PVD tool to deposit highly reactive materialsIBM·Filed 2017·Granted Jun 17, 2025·0 cites·19 claims
- 0465US8637836B1High aspect ratio sample holderIBM·Filed 2012·Granted Jan 28, 2014·1 cites·8 claims
- 0565US7915146B2Controlled doping of semiconductor nanowiresIBM·Filed 2007·Granted Mar 29, 2011·2 cites·20 claims
- 0664US8539611B1Scanned probe microscopy (SPM) probe having angled tipREUTER MARK C·Filed 2012·Granted Sep 17, 2013·1 cites·15 claims
- 0757US10570504B2Structure and method to fabricate highly reactive physical vapor deposition targetIBM·Filed 2017·Granted Feb 25, 2020·0 cites·20 claims
- 0853US2018269044A1Pvd tool to deposit highly reactive materialsIBM·Filed 2017·Application pending·0 cites
- 0952US8683611B2High resolution AFM tips containing an aluminum-doped semiconductor nanowireCOHEN GUY·Filed 2012·Granted Mar 25, 2014·0 cites·15 claims
- 1052US2014082920A1High aspect ratio sample holderIBM·Filed 2012·Application pending·0 cites
- 1151US8474061B2Production scale fabrication method for high resolution AFM tipsCOHEN GUY·Filed 2012·Granted Jun 25, 2013·0 cites·16 claims
- 1246US8893310B2Scanned probe microscopy (SPM) probe having angled tipREUTER MARK C·Filed 2012·Granted Nov 18, 2014·0 cites·19 claims
- 1336US2005181624A1Method of forming quantum dots at predetermined positions on a substrateIBM·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →