Inventor · disambiguated record
Manoj Sachdev
Also filed as: SACHDEV MANOJ
36 granted patents·7 pending applications·375 citations·filing 1994–2025
97Inventor score
Top patents by PatentIndex Score
43 records- 0193US8363455B2Eight transistor soft error robust storage cellRENNIE DAVID·Filed 2009·Granted Jan 29, 2013·33 cites·13 claims
- 0291US8536898B2SRAM sense amplifierRENNIE DAVID JAMES·Filed 2011·Granted Sep 17, 2013·30 cites·6 claims
- 0382US11082241B2Physically unclonable function with feed-forward addressing and variable latency outputINTEL CORP·Filed 2018·Granted Aug 3, 2021·3 cites·6 claims
- 0481US7583555B2Robust and Efficient dynamic voltage scaling for portable devicesQUALCOMM INC·Filed 2004·Granted Sep 1, 2009·37 cites·13 claims
- 0580US11483167B2Method and apparatus to provide memory based physically unclonable functionsINTEL CORP·Filed 2019·Granted Oct 25, 2022·2 cites·21 claims
- 0680US8072797B2SRAM cell without dedicated access transistorsSACHDEV MANOJ·Filed 2009·Granted Dec 6, 2011·13 cites·21 claims
- 0779US7372721B2Segmented column virtual ground scheme in a static random access memory (SRAM) circuitSACHDEV MANOJ·Filed 2006·Granted May 13, 2008·14 cites·19 claims
- 0874US5491665AIDDQ -testable RAMPHILIPS CORP·Filed 1994·Granted Feb 13, 1996·32 cites·12 claims
- 0973US8760912B2Eight transistor soft error robust storage cellTIRABOSCHI SERVICES LLC·Filed 2013·Granted Jun 24, 2014·3 cites·25 claims
- 1072US7613067B2Soft error robust static random access memory cellsSACHDEV MANOJ·Filed 2007·Granted Nov 3, 2009·8 cites·8 claims
- 1172US6765414B2Low frequency testing, leakage control, and burn-in control for high-performance digital circuitsINTEL CORP·Filed 2002·Granted Jul 20, 2004·16 cites·18 claims
- 1269US8164943B2Soft error robust storage SRAM cells and flip-flopsSACHDEV MANOJ·Filed 2010·Granted Apr 24, 2012·4 cites·11 claims
- 1368US7643329B2Asymmetric four-transistor SRAM cellCERTICHIP INC·Filed 2007·Granted Jan 5, 2010·8 cites·16 claims
- 1467US9542995B2Threshold voltage mismatch compensation sense-amplifiers for static random access memories with multiple differential inputsSACHDEV MANOJ·Filed 2014·Granted Jan 10, 2017·3 cites·14 claims
- 1567US5625300ASeparate IDDQ -testing of signal path and bias path in an ICFiled 1994·Granted Apr 29, 1997·25 cites·10 claims
- 1665US2025265998A1Method and system for cmos-like logic gates using tfts and applications thereforGOHARDEHI SHEIDA·Filed 2025·Application pending·0 cites
- 1763US7200057B2Test for weak SRAM cellsNXP BV·Filed 2004·Granted Apr 3, 2007·15 cites·17 claims
- 1863US5495448AMemory testing through cumulative word line activationPHILIPS CORP·Filed 1995·Granted Feb 27, 1996·21 cites·6 claims
- 1962US12322348B2Low-power active matrix display with row and/or data driver energy recycling techniquesGOHARDEHI SHEIDA·Filed 2023·Granted Jun 3, 2025·0 cites·5 claims
- 2061US12288520B2Method and system for CMOS-like logic gates using TFTs and applications thereforGOHARDEHI SHEIDA·Filed 2022·Granted Apr 29, 2025·0 cites·13 claims
- 2159US6134688AElectronic device selectably operable as a sequential logic circuit or a combinatorial logic circuit and circuit testing methodPHILIPS CORP·Filed 1997·Granted Oct 17, 2000·15 cites·7 claims
- 2256US9401199B2Eight transistor soft error robust storage cellTIRABOSCHI SERVICES LLC·Filed 2014·Granted Jul 26, 2016·1 cites·14 claims
- 2356US5831463AMOS master-slave flip-flop with reduced number of pass gatesPHILIPS CORP·Filed 1996·Granted Nov 3, 1998·19 cites·14 claims
- 2456US2024264227A1System for and method of improving the yield of integrated circuitsZINITE CORP·Filed 2024·Application pending·0 cites
- 2555US9083320B2Apparatus and method for electrical stability compensationYANG MAOFENG·Filed 2013·Granted Jul 14, 2015·1 cites·17 claims
- 2655US8488403B2Sense-amplification with offset cancellation for static random access memoriesSACHDEV MANOJ·Filed 2010·Granted Jul 16, 2013·2 cites·15 claims
- 2755US6369631B1High performance impulse flip-flopsINTEL CORP·Filed 2000·Granted Apr 9, 2002·6 cites·21 claims
- 2854US6445235B1Iddq-testable uni-directional master-slavePHILIPS CORP·Filed 1995·Granted Sep 3, 2002·17 cites·10 claims
- 2953US6429711B1Stack-based impulse flip-flop with stack node pre-charge and stack node pre-dischargeINTEL CORP·Filed 2000·Granted Aug 6, 2002·6 cites·15 claims
- 3052US2025252909A1Methods and systems for reducing power consumption of electronic displays with in-pixel sram cell and unweighted pwm driving schemeRANJAN SHUBHAM·Filed 2025·Application pending·0 cites
- 3149US7872938B2Soft error robust static random access memory cell storage configuration.CERTICHIP INC·Filed 2009·Granted Jan 18, 2011·2 cites·8 claims
- 3245US6366147B2High performance impulse flip-flopsINTEL CORP·Filed 2001·Granted Apr 2, 2002·3 cites·16 claims
- 3345US6127838AIDDQ testable programmable logic arraysPHILIPS CORP·Filed 1998·Granted Oct 3, 2000·11 cites·13 claims
- 3445US2011133247A1Zener-Triggered SCR-Based Electrostatic Discharge Protection Devices For CDM And HBM Stress ConditionsSARBISHAEI HOSSEIN·Filed 2009·Application pending·0 cites
- 3544US2025209978A1Methods and systems for reducing power consumption in low- power amoled displays using column line segmentationRANJAN SHUBHAM·Filed 2024·Application pending·0 cites
- 3642US2022230587A1Opto-electronic device fabrication method and electronic circuitLI QING·Filed 2019·Application pending·0 cites
- 3741US7714628B2Soft error robust flip-flopsCERTICHIP INC·Filed 2008·Granted May 11, 2010·1 cites·14 claims
- 3841US5969653ATesting control signals in A/D convertersPHILIPS CORP·Filed 1997·Granted Oct 19, 1999·8 cites·17 claims
- 3937US5831986AFault-tolerant memory address decoderPHILIPS CORP·Filed 1995·Granted Nov 3, 1998·5 cites·3 claims
- 4037US5781025AMethod for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testingPHILIPS CORP·Filed 1996·Granted Jul 14, 1998·8 cites·6 claims
- 4129US5751141AIDDQ -testing of bias generator circuitPHILIPS CORP·Filed 1995·Granted May 12, 1998·3 cites·6 claims
- 4228US10396796B2Circuit, system and method for thin-film transistor logic gatesPAPADOPOULOS NIKOLAOS·Filed 2016·Granted Aug 27, 2019·0 cites·20 claims
- 4326US2006125547A1Adjustable and programmable temperature coefficient-proportional to absolute temperature (APTC-PTAT) circuitMAYMANDI-NEJAD MOHAMMAD·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →