Inventor · disambiguated record

Mazan Saied

Also filed as: SAIED MAZEN

1 granted patent·2 citations·filing 2013–2013

18Inventor score

Technology areasG06T

Files withCOMMISSARIAT L ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES1

Top patents by PatentIndex Score

1 record

0156US8723116B2Method of determining an applicable threshold for determining the critical dimension of at least one category of patterns imaged by atomic force scanning electron microscopyCOMMISSARIAT L ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES·Filed 2013·Granted May 13, 2014·2 cites·11 claims

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