Inventor · disambiguated record
Masakatsu Saijyo
Also filed as: SAIJYO MASAKATSU
1 granted patent·1 pending application·77 citations·filing 2003–2005
53Inventor score
Technology areasG01R
Top patents by PatentIndex Score
2 records- 0191US6927078B2Method of measuring contact resistance of probe and method of testing semiconductor deviceOKI ELECTRIC IND CO LTD·Filed 2003·Granted Aug 9, 2005·77 cites·17 claims
- 0235US2005258835A1Method of measuring contact resistance of probe and method of testing semiconductor deviceSAIJYO MASAKATSU·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →