Inventor · disambiguated record
Makoto Sakakibara
Also filed as: SAKAKIBARA MAKOTO
36 granted patents·7 pending applications·117 citations·filing 1995–2021
95Inventor score
Files withHITACHI HIGH TECH CORP23HITACHI LTD6KAO CORP5MOMENTIVE PERFORMANCE MAT JP23M INNOVATIVE PROPERTIES CO1
Top patents by PatentIndex Score
43 records- 0191US11011348B2Scanning electron microscope and sample observation method using scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted May 18, 2021·8 cites·12 claims
- 0289US7425714B2Measurement method of electron beam current, electron beam writing system and electron beam detectorHITACHI HIGH TECH CORP·Filed 2005·Granted Sep 16, 2008·12 cites·12 claims
- 0386US11257658B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Feb 22, 2022·3 cites·7 claims
- 0486US10184595B2Duct and method of manufacturing the sameINOUE MTP KK·Filed 2016·Granted Jan 22, 2019·2 cites·10 claims
- 0583US7423274B2Electron beam writing system and electron beam writing methodHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 9, 2008·7 cites·12 claims
- 0682US9966225B2Charged particle beam device, simulation method, and simulation deviceHITACHI LTD·Filed 2014·Granted May 8, 2018·5 cites·13 claims
- 0777US9520266B2Pattern critical dimension measurement equipment and method for measuring pattern critical dimensionHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 13, 2016·4 cites·20 claims
- 0876US12176181B2Pattern inspecting deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 24, 2024·1 cites·16 claims
- 0975US5590208ASpeaker systemPIONEER ELECTRONIC CORP·Filed 1995·Granted Dec 31, 1996·64 cites·6 claims
- 1071US6730780B2Water-based inkKAO CORP·Filed 2001·Granted May 4, 2004·7 cites·9 claims
- 1166US10755396B2Image forming apparatusHITACHI LTD·Filed 2018·Granted Aug 25, 2020·1 cites·12 claims
- 1261US12394586B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 19, 2025·0 cites·15 claims
- 1361US11518110B2Adhesive application apparatusMOMENTIVE PERFORMANCE MAT JP·Filed 2021·Granted Dec 6, 2022·0 cites·14 claims
- 1458US12205790B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 21, 2025·0 cites·10 claims
- 1558US12125667B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 22, 2024·0 cites·10 claims
- 1658US7939780B2Abnormality determination and estimation method, and abnormality determination and estimation device for weld productDENSO CORP·Filed 2006·Granted May 10, 2011·1 cites·9 claims
- 1756US2015337188A1Two-pack curable polyorganosiloxane composition and use thereofMOMENTIVE PERFORMANCE MAT JP·Filed 2013·Application pending·0 cites
- 1854US12057288B2Charged particle beam device and inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 6, 2024·0 cites·15 claims
- 1953US12196802B2Semiconductor inspection device and method for inspecting semiconductor sampleHITACHI HIGH TECH CORP·Filed 2020·Granted Jan 14, 2025·0 cites·19 claims
- 2053US7112619B2Water-based inkKAO CORP·Filed 2003·Granted Sep 26, 2006·2 cites·19 claims
- 2152US11524929B2Method for producing alpha-allylated cycloalkanoneKAO CORP·Filed 2020·Granted Dec 13, 2022·0 cites·15 claims
- 2252US11170969B2Electron beam observation device, electron beam observation system, and control method of electron beam observation deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 9, 2021·0 cites·16 claims
- 2351US11685705B2Method for producing α-allylated cycloalkanoneKAO CORP·Filed 2020·Granted Jun 27, 2023·0 cites·17 claims
- 2451US11227740B2Electron gun and electron beam application deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 18, 2022·0 cites·9 claims
- 2551US10361063B2Charged particle detector and charged particle beam device using the sameHITACHI LTD·Filed 2018·Granted Jul 23, 2019·0 cites·14 claims
- 2649US10319562B2Charged particle beam deviceHITACHI LTD·Filed 2018·Granted Jun 11, 2019·0 cites·11 claims
- 2749US2008090085A1Heat curable adhesive composition, article, semiconductor apparatus and method3M INNOVATIVE PROPERTIES CO·Filed 2007·Application pending·0 cites
- 2848US11791130B2Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 17, 2023·0 cites·28 claims
- 2948US2007144399A1Water-based inks for ink-jet printingKAO CORP·Filed 2006·Application pending·0 cites
- 3047US10825649B2Electron beam deviceHITACHI LTD·Filed 2019·Granted Nov 3, 2020·0 cites·9 claims
- 3147US9287082B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Mar 15, 2016·0 cites·12 claims
- 3244US11967482B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 23, 2024·0 cites·4 claims
- 3344US11380518B2Measurement system and method for setting observation conditions of measurement apparatusHITACHI LTD·Filed 2019·Granted Jul 5, 2022·0 cites·14 claims
- 3444US2022218384A1Vibration type removal apparatusMICRON MACHINERY CO LTD·Filed 2020·Application pending·0 cites
- 3544US2013248731A1Electron beam apparatus and lens arrayHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 3643US12512294B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 30, 2025·0 cites·10 claims
- 3743US10217604B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Feb 26, 2019·0 cites·15 claims
- 3842US10636618B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 28, 2020·0 cites·15 claims
- 3939US11282671B2Charged-particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 22, 2022·0 cites·11 claims
- 4038US10707047B2Measuring device and measuring methodHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 7, 2020·0 cites·12 claims
- 4138US2006011869A1Measurement method of electron beam current, electron beam lithography method and systemTANAKA NORIYUKI·Filed 2005·Application pending·0 cites
- 4235US10014160B2Scanning electron microscope and method for controlling sameHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 3, 2018·0 cites·20 claims
- 4333US2005224978A1Heat curable adhesive composition, article, semiconductor apparatus and methodKAWATE KOHICHIRO·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →