Inventor · disambiguated record
Masaru Sanada
Also filed as: SANADA MASARU
16 granted patents·5 pending applications·266 citations·filing 1989–2019
94Inventor score
Files withNEC CORP11MAEKAWA SEISAKUSHO KK2NIPPON TELEGRAPH & TELEPHONE2MITSUBISHI ELECTRIC CORP1NEC COPORATION1
Top patents by PatentIndex Score
21 records- 0179US5732569AAdsorption type cooling apparatus, method of controlling cold output of same, and fin type adsorbent heat exchanger for use in the sameMAEKAWA SEISAKUSHO KK·Filed 1994·Granted Mar 31, 1998·43 cites·6 claims
- 0277US6041617AAdsorption type cooling apparatus, method of controlling cold output of same, and fin type adsorbent heat exchanger for use in sameMAEKAWA SEISAKUSHO KK·Filed 1997·Granted Mar 28, 2000·40 cites·2 claims
- 0376US6883115B2LSI diagnostic system and method of diagnosing LSINEC ELECTRONICS CORP·Filed 2002·Granted Apr 19, 2005·20 cites·17 claims
- 0469US5944847AMethod and system for identifying failure pointNIPPON ELECTRIC CO·Filed 1997·Granted Aug 31, 1999·31 cites·9 claims
- 0567US5024314AEscalator system with convertible steps for wheel chairMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Jun 18, 1991·22 cites·13 claims
- 0654US2002002484A1Method for processing formation and sale of merchandise by means of a networkNEC CORP·Filed 2001·Application pending·0 cites
- 0754US2001056373A1Performer collection for promotion video through internet and production of promotion videoNEC CORP·Filed 2001·Application pending·0 cites
- 0853US6173426B1Method of locating faults in LSINEC CORP·Filed 1998·Granted Jan 9, 2001·17 cites·10 claims
- 0953US5850404AFault block detecting system using abnormal currentNEC CORP·Filed 1997·Granted Dec 15, 1998·19 cites·14 claims
- 1051US11977648B2Information protection apparatus, information protection method and programNIPPON TELEGRAPH & TELEPHONE·Filed 2019·Granted May 7, 2024·0 cites·3 claims
- 1151US5943346AFault point estimating system using abnormal current and potential contrast imagesNEC CORP·Filed 1996·Granted Aug 24, 1999·17 cites·25 claims
- 1247US5889789AFault mode estimating system using abnormal current and V-I characteristicsNEC COPORATION·Filed 1996·Granted Mar 30, 1999·14 cites·18 claims
- 1343US2022201028A1Caution-needed ip address estimation apparatus, monitoring system, caution-needed ip address providing method and programNIPPON TELEGRAPH & TELEPHONE·Filed 2019·Application pending·0 cites
- 1442US5640099AMethod and apparatus for detecting short circuit point between wiring patternsNEC CORP·Filed 1995·Granted Jun 17, 1997·10 cites·15 claims
- 1541US5329139ASemiconductor integrated circuit device analyzable by using laser beam inducing currentNEC CORP·Filed 1993·Granted Jul 12, 1994·9 cites·4 claims
- 1640US6136618ASemiconductor device manufacturing process diagnosis system suitable for diagnoses of manufacturing process of logic LSI composed of a plurality of logic circuit blocks and diagnosis method thereofNEC CORP·Filed 1998·Granted Oct 24, 2000·8 cites·27 claims
- 1738US6285040B1Internal-logic inspection circuitNEC CORP·Filed 1999·Granted Sep 4, 2001·7 cites·9 claims
- 1835US5864566AFault block detecting system using abnormal current and abnormal data outputNEC CORP·Filed 1997·Granted Jan 26, 1999·5 cites·6 claims
- 1935US2003218474A1Wafer testing apparatusFiled 2003·Application pending·0 cites
- 2034US6144084ASemiconductor integrated circuit having a logic verifying structure and method of manufacturing the sameNEC CORP·Filed 1998·Granted Nov 7, 2000·4 cites·17 claims
- 2134US2001050936A1Logic determination device for semiconductor integrated device and logic determination methodFiled 2001·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Masaru Sanada files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →