Inventor · disambiguated record
Masaki Shiba
Also filed as: SHIBA MASAKI
18 granted patents·7 pending applications·77 citations·filing 2001–2020
90Inventor score
Top patents by PatentIndex Score
25 records- 0188US11726028B2Container rack, specimen analysis device, and specimen analysis methodSYSMEX CORP·Filed 2020·Granted Aug 15, 2023·2 cites·22 claims
- 0288US6522976B2Automatic analysis systemHITACHI LTD·Filed 2001·Granted Feb 18, 2003·35 cites·8 claims
- 0379US9151703B2Sample analyzer and a sample analyzing methodSYSMEX CORP·Filed 2013·Granted Oct 6, 2015·3 cites·7 claims
- 0479US8158058B2Automatic analyzerSHIBA MASAKI·Filed 2004·Granted Apr 17, 2012·15 cites·2 claims
- 0579US7749441B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 6, 2010·21 cites·12 claims
- 0673US9915594B2Sample analyzer and a sample analyzing methodSYSMEX CORP·Filed 2015·Granted Mar 13, 2018·1 cites·20 claims
- 0771US10605817B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 31, 2020·0 cites·4 claims
- 0871US2020141959A1Automatic analyzerHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
- 0956US9513302B2Reagent transfer deviceSHIBA MASAKI·Filed 2012·Granted Dec 6, 2016·0 cites·3 claims
- 1055US10151766B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 11, 2018·0 cites·3 claims
- 1152US2011104810A1Automatic analyzerHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 1251US11666920B2Method of cleaning aspiration tube and specimen measuring apparatusSYSMEX CORP·Filed 2020·Granted Jun 6, 2023·0 cites·10 claims
- 1349US2020300879A1Specimen measurement device, specimen measurement method, and nozzleSYSMEX CORP·Filed 2020·Application pending·0 cites
- 1448US11754580B2Sample measurement method and sample measurement deviceSYSMEX CORP·Filed 2018·Granted Sep 12, 2023·0 cites·17 claims
- 1546US12078648B2Sample measurement device and sample measurement methodSYSMEX CORP·Filed 2020·Granted Sep 3, 2024·0 cites·10 claims
- 1646US11846632B2Sample measurement device and sample measurement methodSYSMEX CORP·Filed 2018·Granted Dec 19, 2023·0 cites·16 claims
- 1746US11400455B2Sample measuring system and sample measuring methodSYSMEX CORP·Filed 2019·Granted Aug 2, 2022·0 cites·24 claims
- 1846US2019201904A1Sample measuring apparatus and sample measuring methodSYSMEX CORP·Filed 2018·Application pending·0 cites
- 1945US9889443B2Sample analyzer and sample analyzing methodSYSMEX CORP·Filed 2015·Granted Feb 13, 2018·0 cites·13 claims
- 2044US9645160B2Automatic analysis deviceADACHI SAKUICHIRO·Filed 2012·Granted May 9, 2017·0 cites·8 claims
- 2141US2013294974A1Automatic analyzerSHIBA MASAKI·Filed 2011·Application pending·0 cites
- 2240US10640867B2Method for manufacturing metallized filmPANASONIC IP MAN CO LTD·Filed 2018·Granted May 5, 2020·0 cites·12 claims
- 2340US7776264B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 17, 2010·0 cites·8 claims
- 2440US2013108509A1Automatic analysis deviceSHIBA MASAKI·Filed 2011·Application pending·0 cites
- 2540US2013132022A1Automatic analyzer and automatic analysis methodTAMURA TAKUO·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →