Inventor · disambiguated record
Masayoshi Shirahata
Also filed as: SHIRAHATA MASAYOSHI
22 granted patents·387 citations·filing 1994–2020
95Inventor score
Top patents by PatentIndex Score
22 records- 0197US6461920B1Semiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 8, 2002·124 cites·6 claims
- 0284US6144079ASemiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Nov 7, 2000·62 cites·8 claims
- 0383US11336857B2Solid-state imaging device, method for driving solid-state imaging device, and electronic apparatusBRILLNICS JAPAN INC·Filed 2020·Granted May 17, 2022·2 cites·15 claims
- 0483US10356353B2Solid-state imaging device, method for driving solid-state imaging device, and electronic apparatusBRILLNICS JAPAN INC·Filed 2018·Granted Jul 16, 2019·3 cites·16 claims
- 0579US10382708B2Solid-state imaging device, method for driving solid-state imaging device, and electronic apparatus with physically unclonable functionBRILLNICS INC·Filed 2016·Granted Aug 13, 2019·3 cites·37 claims
- 0676US6521963B1Semiconductor device and method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Feb 18, 2003·37 cites·9 claims
- 0774US6333222B1Semiconductor device and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Dec 25, 2001·31 cites·12 claims
- 0871US5594264ALDD semiconductor device with peak impurity concentrationsMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 14, 1997·32 cites·5 claims
- 0969US5683923ASemiconductor memory device capable of electrically erasing and writing information and a manufacturing method of the sameMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Nov 4, 1997·25 cites·4 claims
- 1068US11637982B2Solid-state imaging device, method for driving solid-state imaging device, and electronic apparatusBRILLNICS JAPAN INC·Filed 2019·Granted Apr 25, 2023·1 cites·15 claims
- 1163US6248653B1Method of manufacturing gate structureMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jun 19, 2001·11 cites·20 claims
- 1258US10484638B2Solid-state imaging device, method for driving solid-state imaging device, and electronic apparatus for preventing tampering of an imageBRILLNICS JAPAN INC·Filed 2019·Granted Nov 19, 2019·0 cites·11 claims
- 1351US6521517B1Method of fabricating a gate electrode using a second conductive layer as a mask in the formation of an insulating layer by oxidation of a first conductive layerMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 18, 2003·3 cites·10 claims
- 1451US5488245ASemiconductor memory device capable of electrically erasing and writing informationMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jan 30, 1996·11 cites·16 claims
- 1548US6686059B2Semiconductor device manufacturing method and semiconductor deviceRENESAS TECH CORP·Filed 2001·Granted Feb 3, 2004·4 cites·3 claims
- 1647US6335556B1Semiconductor device and method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 1, 2002·13 cites·4 claims
- 1746US6737336B2Semiconductor device and manufacturing method thereforRENESAS TECH CORP·Filed 2002·Granted May 18, 2004·2 cites·10 claims
- 1845US6163046ASemiconductor device and method of fabricating semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Dec 19, 2000·8 cites·9 claims
- 1943US6417555B1Semiconductor device and manufacturing method thereforMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jul 9, 2002·9 cites·9 claims
- 2037US6872628B2Method of manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Mar 29, 2005·0 cites·15 claims
- 2134US6525380B2CMOS with a fixed charge in the gate dielectricMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Feb 25, 2003·6 cites·7 claims
- 2229US6555887B1Semiconductor device with multi-layer interconnectionMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Apr 29, 2003·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →