Inventor · disambiguated record
Masataka Shiratsuchi
Also filed as: SHIRATSUCHI MASATAKA
41 granted patents·11 pending applications·329 citations·filing 1995–2025
97Inventor score
Files withTOSHIBA KK22NUFLARE TECHNOLOGY INC15HAYASHIHARA HIROMICHI2MORINO TAKESHI2MORIYAMA TAKAYOSHI2
Top patents by PatentIndex Score
52 records- 0198US7663769B2Sheet thickness measuring device and image forming apparatusTOSHIBA KK·Filed 2008·Granted Feb 16, 2010·52 cites·24 claims
- 0293US11417495B2Multi-charged particle beam irradiation apparatus and multi-charged particle beam inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2021·Granted Aug 16, 2022·2 cites·14 claims
- 0392US11385192B2Inspection apparatus and inspection methodNUFLARE TECHNOLOGY INC·Filed 2020·Granted Jul 12, 2022·2 cites·18 claims
- 0492US8696184B2Surface light source deviceMORINO TAKESHI·Filed 2012·Granted Apr 15, 2014·17 cites·7 claims
- 0591US8396384B2Apparatus and method of determining the type of paper sheet, and image formation apparatusHAYASHIHARA HIROMICHI·Filed 2011·Granted Mar 12, 2013·10 cites·10 claims
- 0690US7648256B2Lighting system having lenses for light sources emitting rays at different wavelengthsTOSHIBA KK·Filed 2006·Granted Jan 19, 2010·47 cites·8 claims
- 0787US5995303AOptical element and optical deviceTOSHIBA KK·Filed 1995·Granted Nov 30, 1999·78 cites·26 claims
- 0886US11004193B2Inspection method and inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2019·Granted May 11, 2021·2 cites·12 claims
- 0985US10997713B2Inspection device, inspection method, and storage mediumTOSHIBA KK·Filed 2019·Granted May 4, 2021·4 cites·17 claims
- 1083US10180529B2Illumination device and light-guiding memberTOSHIBA KK·Filed 2014·Granted Jan 15, 2019·8 cites·20 claims
- 1181US6344928B1Display deviceTOSHIBA KK·Filed 2000·Granted Feb 5, 2002·21 cites·21 claims
- 1280US11101103B2Multiple electron beam inspection apparatus and multiple electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2020·Granted Aug 24, 2021·1 cites·10 claims
- 1380US10712295B2Electron beam inspection apparatus and electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Jul 14, 2020·1 cites·20 claims
- 1478US10041892B2Charged particle beam inspection apparatus and charged particle beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2017·Granted Aug 7, 2018·2 cites·10 claims
- 1578US9281328B2Image sensor that includes a boundary region formed between a logic circuit region and an image-sensing element region and manufacturing method thereofTOSHIBA KK·Filed 2013·Granted Mar 8, 2016·3 cites·18 claims
- 1678US8797607B2Method and apparatus for deciding recording media based on light from a linear light source that passes a slit in a light shielding portionHAYASHIHARA HIROMICHI·Filed 2011·Granted Aug 5, 2014·4 cites·20 claims
- 1778US8305863B2Optical information recording apparatusTATSUTA SHINICHI·Filed 2011·Granted Nov 6, 2012·5 cites·8 claims
- 1874US10775326B2Electron beam inspection apparatus and electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Sep 15, 2020·1 cites·11 claims
- 1973US10984978B2Multiple electron beam inspection apparatus and multiple electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Apr 20, 2021·1 cites·15 claims
- 2071US9442239B2Illuminating deviceTOSHIBA KK·Filed 2014·Granted Sep 13, 2016·2 cites·15 claims
- 2171US8437236B2Optical information recording/reproducing apparatus and methodTATSUTA SHINICHI·Filed 2009·Granted May 7, 2013·2 cites·2 claims
- 2269US9059060B2Image sensor including an image-sensing element region and logic circuit region and manufacturing method thereofTOSHIBA KK·Filed 2013·Granted Jun 16, 2015·0 cites·15 claims
- 2368US10846846B2Pattern inspection apparatus and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2018·Granted Nov 24, 2020·1 cites·12 claims
- 2468US8004655B2Automatic focus adjusting mechanism and optical image acquisition apparatusTOSHIBA KK·Filed 2010·Granted Aug 23, 2011·2 cites·6 claims
- 2566US2024175829A1Inspection apparatus and inspection methodNUFLARE TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 2665US10762383B2Pattern inspection apparatus and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2018·Granted Sep 1, 2020·1 cites·8 claims
- 2765US9194568B2Lighting unit and lighting deviceMORIYAMA TAKAYOSHI·Filed 2012·Granted Nov 24, 2015·2 cites·13 claims
- 2864US9436001B2Light beam scannerTOSHIBA KK·Filed 2015·Granted Sep 6, 2016·1 cites·10 claims
- 2962US6421451B2Step difference detection apparatus and processing apparatus using the sameTOSHIBA KK·Filed 1998·Granted Jul 16, 2002·55 cites·24 claims
- 3057US10984525B2Pattern inspection method and pattern inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2019·Granted Apr 20, 2021·0 cites·15 claims
- 3155US9410689B2Lighting apparatusTOSHIBA KK·Filed 2014·Granted Aug 9, 2016·0 cites·17 claims
- 3255US2014049986A1Light guide body and surface light sourceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 3354US7618161B2Fresnel lens and lighting apparatus provided with the Fresnel lensTOSHIBA KK·Filed 2005·Granted Nov 17, 2009·2 cites·9 claims
- 3452US12354831B2Pattern inspection apparatus and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2022·Granted Jul 8, 2025·0 cites·10 claims
- 3551US2012236539A1Light guide plate, light source device, and display deviceSHIRATSUCHI MASATAKA·Filed 2011·Application pending·0 cites
- 3651US2025132119A1Multi-electron beam image acquisition apparatus, multi-electron beam image acquisition method, electron beam image acquisition apparatus, and electron beam image acquisition methodNUFLARE TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3750US9484382B2Image sensor and manufacturing method thereofTOSHIBA KK·Filed 2015·Granted Nov 1, 2016·0 cites·7 claims
- 3850US9372389B2Projector and portable terminalTOSHIBA KK·Filed 2014·Granted Jun 21, 2016·0 cites·19 claims
- 3950US2012113680A1Light guide body and surface light sourceNAKAI YUTAKA·Filed 2011·Application pending·0 cites
- 4046US2014126237A1Surface light source deviceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 4145US9466517B2Microwave annealing apparatus and method of manufacturing a semiconductor deviceTOSHIBA KK·Filed 2013·Granted Oct 11, 2016·0 cites·9 claims
- 4245US8400579B2Liquid crystal display and backlight module with tilting reflective surfaceMOMONOI YOSHIHARU·Filed 2011·Granted Mar 19, 2013·0 cites·16 claims
- 4345US2013250574A1Lighting unit and lighting deviceMORIYAMA TAKAYOSHI·Filed 2012·Application pending·0 cites
- 4444US7715612B2Discriminating apparatusTOSHIBA KK·Filed 2005·Granted May 11, 2010·0 cites·18 claims
- 4543US8610967B2Illumination apparatus and image reading apparatus including the sameIKARI SEIJI·Filed 2012·Granted Dec 17, 2013·0 cites·19 claims
- 4643US2019346769A1Pattern inspection apparatus and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Application pending·0 cites
- 4742US2002053647A1Pattern detection, processing and testing apparatusFiled 2001·Application pending·0 cites
- 4841US10359468B2Thermal laser stimulation apparatus, method of thermally stimulating, and non-transitory computer readable mediumTOSHIBA MEMORY CORP·Filed 2016·Granted Jul 23, 2019·0 cites·17 claims
- 4941US9371967B2Lighting apparatus with heat transfer and light guiding structureKATO MITSUAKI·Filed 2012·Granted Jun 21, 2016·0 cites·25 claims
- 5041US2012113682A1Surface lighting apparatusMORINO TAKESHI·Filed 2011·Application pending·0 cites
Showing the top 50 of 52 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →