Inventor · disambiguated record
Markus Stein
Also filed as: STEIN MARKUS
6 granted patents·7 pending applications·24 citations·filing 2001–2025
77Inventor score
Files withAUGUST RUGGEBERG GMBH & CO KG2INFINEON TECHNOLOGIES AG2KONERMANN STEFAN2PLAST CONTROL GERAETEBAU GMBH2PLAST CONTROL GMBH2
Top patents by PatentIndex Score
13 records- 0168US8561313B2Apparatus for measuring film bubblesMUELLER FRANK·Filed 2011·Granted Oct 22, 2013·1 cites·6 claims
- 0268US6605950B2Method and apparatus for measuring film thicknessesPLAST CONTROL GERAETEBAU GMBH·Filed 2001·Granted Aug 12, 2003·10 cites·18 claims
- 0362US7369255B2Apparatus and method for capacitive measurement of materialsPLAST CONTROL GMBH·Filed 2006·Granted May 6, 2008·5 cites·16 claims
- 0456US2024162099A1Power semiconductor module arrangement and method for assembling the sameINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 0556US2024153832A1Power Semiconductor Module ArrangementINFINEON TECHNOLOGIES AG·Filed 2023·Application pending·0 cites
- 0655US8561455B2Sensor head for film measurementsKONERMANN STEFAN·Filed 2010·Granted Oct 22, 2013·1 cites·6 claims
- 0753US6541986B2Sensor for the capacitive measurement of film with thicknessesPLAST CONTROL GERAETEBAU GMBH·Filed 2001·Granted Apr 1, 2003·7 cites·15 claims
- 0852US2025379800A1Distributed communication and monitoring systemROHDE & SCHWARZ·Filed 2025·Application pending·0 cites
- 0945US2009299930A1Method of Measuring the Thickness Profile of a Film TubePLAST CONTROL GMBH·Filed 2009·Application pending·0 cites
- 1039US8315833B2Method for contactless capacitive thickness measurementsKONERMANN STEFAN·Filed 2008·Granted Nov 20, 2012·0 cites·11 claims
- 1138US2015027254A1Motor Vehicle Drive Train Device Comprising a Multi-Group TransmissionDAIMLER AG·Filed 2013·Application pending·0 cites
- 1236US2007010184A1Tool with a carrier part and a disc-shaped working partAUGUST RUGGEBERG GMBH & CO KG·Filed 2006·Application pending·0 cites
- 1334US2005153640A1ToolAUGUST RUGGEBERG GMBH & CO KG·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →