Inventor · disambiguated record
Martin Streibl
Also filed as: STREIBL MARTIN
20 granted patents·5 pending applications·217 citations·filing 2002–2017
94Inventor score
Top patents by PatentIndex Score
25 records- 0194US6905892B2Operating method for a semiconductor componentINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 14, 2005·102 cites·11 claims
- 0293US7221615B2Semiconductor memory chipINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 22, 2007·30 cites·10 claims
- 0389US7184360B2High-speed interface circuit for semiconductor memory chips and memory system including semiconductor memory chipsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 27, 2007·24 cites·32 claims
- 0482US7087938B2ESD protective circuit with collector-current-controlled triggering for a monolithically integrated circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Aug 8, 2006·10 cites·17 claims
- 0581US9582451B2Receiver architectureINFINEON TECHNOLOGIES AG·Filed 2013·Granted Feb 28, 2017·5 cites·29 claims
- 0670US6930501B2Method for determining an ESD/latch-up strength of an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 16, 2005·18 cites·13 claims
- 0769US7279726B2ESD protection deviceINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 9, 2007·4 cites·20 claims
- 0862US7956665B2Methods and articles of manufacture for operating electronic devices on a plurality of clock signalsQIMONDA AG·Filed 2008·Granted Jun 7, 2011·2 cites·13 claims
- 0959US7388734B2Integrated circiut arrangementINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 17, 2008·2 cites·25 claims
- 1057US8125812B2Method and device for transmitting outgoing useful signals and an outgoing clock signalSTREIBL MARTIN·Filed 2008·Granted Feb 28, 2012·2 cites·25 claims
- 1156US7269093B2Generating a sampling clock signal in a communication block of a memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 11, 2007·3 cites·34 claims
- 1253US7391657B2Semiconductor memory chipINFINEON TECHNOLOGIES AG·Filed 2007·Granted Jun 24, 2008·2 cites·9 claims
- 1353US7009404B2Method and device for testing the ESD resistance of a semiconductor componentINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 7, 2006·6 cites·6 claims
- 1452US10127176B2Receiver architectureINFINEON TECHNOLOGIES AG·Filed 2017·Granted Nov 13, 2018·0 cites·21 claims
- 1550US7864907B2Data receiver with clock recovery circuitQIMONDA AG·Filed 2007·Granted Jan 4, 2011·2 cites·24 claims
- 1650US7359169B2Circuit for protecting integrated circuits against electrostatic dischargesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Apr 15, 2008·4 cites·29 claims
- 1745US7461186B2Data handover unit for transferring data between different clock domains by parallelly reading out data bits from a plurality of storage elementsINFINEON TECHNOLOGIES AG·Filed 2006·Granted Dec 2, 2008·1 cites·30 claims
- 1840US2007208980A1Method of transmitting data between different clock domainsGREGORIUS PETER·Filed 2006·Application pending·0 cites
- 1939US2007153437A1Electrostatic discharge protection of an electronic circuitBARTENSCHLAGER RAINER·Filed 2006·Application pending·0 cites
- 2037US2005263817A1Transistor comprising fill areas in the source drain and/or drain regionWENDEL MARTIN·Filed 2005·Application pending·0 cites
- 2136US7817766B2Apparatus and method for avoiding steady-state oscillations in the generation of clock signalsQIMONDA AG·Filed 2006·Granted Oct 19, 2010·0 cites·20 claims
- 2235US7693247B2Phase locked loop having reduced inherent noiseINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 6, 2010·0 cites·26 claims
- 2335US2006261412A1Process and electrostatic discharge protection device for the protection of a semiconductor circuitESMARK KAI·Filed 2006·Application pending·0 cites
- 2435US2005179088A1ESD protective apparatus for a semiconductor circuit having an ESD protective circuit which makes contact with a substrate or guard ring contactINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 2530US8098471B2Integrated circuit arrangement and circuit arrayKIENMAYER CHRISTOPH·Filed 2005·Granted Jan 17, 2012·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →