Inventor · disambiguated record
Masakazu Sugaya
Also filed as: SUGAYA MASAKAZU
23 granted patents·7 pending applications·630 citations·filing 2000–2019
95Inventor score
Files withHITACHI LTD21HITACHI HIGH TECH CORP3HIROTSU BIO SCIENCE INC2CANON KK1HITACHI HIGH TECH SCIENCE CORP1
Top patents by PatentIndex Score
30 records- 0197US6518548B2Substrate temperature control system and method for controlling temperature of substrateHITACHI LTD·Filed 2002·Granted Feb 11, 2003·269 cites·5 claims
- 0297US6394797B1Substrate temperature control system and method for controlling temperature of substrateHITACHI LTD·Filed 2000·Granted May 28, 2002·182 cites·25 claims
- 0396US6717156B2Beam as well as method and equipment for specimen fabricationHITACHI LTD·Filed 2002·Granted Apr 6, 2004·109 cites·19 claims
- 0491US7408760B2Charged particle beam application systemHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 5, 2008·21 cites·12 claims
- 0584US9040905B2Analysis device and analysis methodNAGANO HISASHI·Filed 2011·Granted May 26, 2015·5 cites·20 claims
- 0683US9261437B2Attached matter inspection deviceHITACHI LTD·Filed 2013·Granted Feb 16, 2016·4 cites·12 claims
- 0783US9214324B2Analysis device and analysis methodHITACHI LTD·Filed 2015·Granted Dec 15, 2015·3 cites·4 claims
- 0881US6687013B2Laser interferometer displacement measuring system, exposure apparatus, and electron beam lithography apparatusHITACHI LTD·Filed 2001·Granted Feb 3, 2004·15 cites·10 claims
- 0979US9696288B2Attached matter testing device and testing methodHITACHI LTD·Filed 2012·Granted Jul 4, 2017·3 cites·11 claims
- 1076US9417163B2Analyzer for substanceHITACHI LTD·Filed 2014·Granted Aug 16, 2016·2 cites·8 claims
- 1173US10138450B2Cell culture deviceHITACHI LTD·Filed 2013·Granted Nov 27, 2018·1 cites·16 claims
- 1271US7341393B2Mechanism for sealingCANON KK·Filed 2005·Granted Mar 11, 2008·3 cites·12 claims
- 1368US9423388B2Particle analyzing deviceHITACHI LTD·Filed 2013·Granted Aug 23, 2016·1 cites·15 claims
- 1468US6839142B2Laser interferometer displacement measuring system, exposure apparatus, and electron beam lithography apparatusHITACHI LTD·Filed 2003·Granted Jan 4, 2005·8 cites·2 claims
- 1567US9850696B2Microparticle detection device and security gateHITACHI LTD·Filed 2013·Granted Dec 26, 2017·4 cites·16 claims
- 1657US10329525B2Liquid feeding device and cell culture deviceHITACHI LTD·Filed 2014·Granted Jun 25, 2019·0 cites·11 claims
- 1756US10087410B2Cell culturing device, culturing vessel, and holding vesselHITACHI LTD·Filed 2013·Granted Oct 2, 2018·0 cites·20 claims
- 1854US10184100B2Liquid delivery device and cell culture device using sameHITACHI LTD·Filed 2013·Granted Jan 22, 2019·0 cites·12 claims
- 1954US2012139736A1Detector and entry control systemSUZUKI YASUTAKA·Filed 2009·Application pending·0 cites
- 2053US10048172B2Substance-testing apparatus, substance-testing system, and substance-testing methodHITACHI LTD·Filed 2014·Granted Aug 14, 2018·0 cites·14 claims
- 2153US2017145365A1Cell culturing device and closed-system culture vesselHITACHI LTD·Filed 2014·Application pending·0 cites
- 2253US2016244713A1Automated culture deviceHITACHI LTD·Filed 2013·Application pending·0 cites
- 2349US10945684B2Ultrasonic CT deviceHITACHI LTD·Filed 2019·Granted Mar 16, 2021·0 cites·13 claims
- 2448US2015068627A1Direction of motion conversion mechanism, actuator device using the same, and reagent manufacturing apparatusHITACHI LTD·Filed 2014·Application pending·0 cites
- 2546US11249069B2Cancer analysis system and cancer analysis methodHIROTSU BIO SCIENCE INC·Filed 2017·Granted Feb 15, 2022·0 cites·7 claims
- 2645US2022065766A1Size distribution measurement device, size distribution measurement method, and sample containerHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Application pending·0 cites
- 2742US11443851B2Cancer test system and method for assessing cancer testHIROTSU BIO SCIENCE INC·Filed 2015·Granted Sep 13, 2022·0 cites·9 claims
- 2841US2017342365A1Closed-system culture vessel, transport method, and automated culturing deviceHITACHI LTD·Filed 2015·Application pending·0 cites
- 2941US2021313138A1Mirror electronic inspection deviceHITACHI HIGH TECH CORP·Filed 2018·Application pending·0 cites
- 3036US10153128B2Charged particle beam apparatus and sample elevating apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 11, 2018·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →