Inventor · disambiguated record
Makoto Suwada
Also filed as: SUWADA MAKOTO
24 granted patents·3 pending applications·42 citations·filing 1991–2017
92Inventor score
Top patents by PatentIndex Score
27 records- 0183US10224078B2Semiconductor device and refresh rate control method of semiconductor device based on measured temperatureFUJITSU LTD·Filed 2017·Granted Mar 5, 2019·4 cites·7 claims
- 0269US7337087B2Circuit analyzing apparatus, circuit analyzing method and circuit analyzing programFUJITSU LTD·Filed 2006·Granted Feb 26, 2008·5 cites·15 claims
- 0364US8331428B2Signal transmission apparatus and signal transmission control methodSUWADA MAKOTO·Filed 2009·Granted Dec 11, 2012·3 cites·21 claims
- 0464US8286343B2Method of manufacturing a wiring substrateSUWADA MAKOTO·Filed 2010·Granted Oct 16, 2012·1 cites·12 claims
- 0562US8756553B2Computer product, design support method, design support apparatus, and manufacture methodFUJITSU LTD·Filed 2012·Granted Jun 17, 2014·1 cites·7 claims
- 0661US8331431B2Signal transmission apparatus and method of controlling the apparatusSUWADA MAKOTO·Filed 2009·Granted Dec 11, 2012·2 cites·20 claims
- 0760US7681156B2Transmission circuit simulator and transmission circuit simulation program storage mediumFUJITSU LTD·Filed 2006·Granted Mar 16, 2010·2 cites·6 claims
- 0859US6925430B2Method of and apparatus for signal-waveform simulation, and computer productFUJITSU LTD·Filed 2001·Granted Aug 2, 2005·8 cites·10 claims
- 0958US7280953B2Noise countermeasure determination method and apparatus and storage mediumFUJITSU LTD·Filed 2001·Granted Oct 9, 2007·7 cites·18 claims
- 1050US9478522B2Electronic part, electronic device, and manufacturing methodFUJITSU LTD·Filed 2015·Granted Oct 25, 2016·0 cites·11 claims
- 1150US7065480B2Noise countermeasure determination method and apparatus and storage mediumFUJITSU LTD·Filed 2000·Granted Jun 20, 2006·2 cites·22 claims
- 1249US9331752B2Memory including wireless communication capabilityFUJITSU LTD·Filed 2014·Granted May 3, 2016·0 cites·5 claims
- 1349US8000662B2Transmission characteristic adjustment device, circuit substrate, and transmission characteristic adjustment methodFUJITSU LTD·Filed 2008·Granted Aug 16, 2011·0 cites·20 claims
- 1448US9508705B2Electronic part, electronic device, and manufacturing methodFUJITSU LTD·Filed 2016·Granted Nov 29, 2016·0 cites·3 claims
- 1548US9230964B2Stacked three dimensional semiconductor device with in-circuit antennaFUJITSU LTD·Filed 2014·Granted Jan 5, 2016·0 cites·3 claims
- 1646US9515005B2Package mounting structureFUJITSU LTD·Filed 2014·Granted Dec 6, 2016·0 cites·6 claims
- 1746US2009168859A1Transmission characteristic adjustment device, circuit board, and transmission characteristic adjustment methodFUJITSU LTD·Filed 2008·Application pending·0 cites
- 1844US2008077892A1Circuit unit designing apparatus, circuit unit designing method, and circuit unit designing programFUJITSU LTD·Filed 2007·Application pending·0 cites
- 1943US10354715B2Semiconductor device and control method for semiconductor deviceFUJITSU LTD·Filed 2017·Granted Jul 16, 2019·0 cites·12 claims
- 2043US9653380B2Method for manufacturing component built-in substrateFUJITSU LTD·Filed 2016·Granted May 16, 2017·0 cites·2 claims
- 2141US5146188AConstant current circuit and an oscillating circuit controlled by the sameFUJITSU LTD·Filed 1991·Granted Sep 8, 1992·7 cites·5 claims
- 2240US9563221B2Semiconductor device and method for setting voltage in semiconductor deviceFUJITSU LTD·Filed 2016·Granted Feb 7, 2017·0 cites·8 claims
- 2339US7103525B2Method of and system for high-frequency-corresponding simulation, and computer productFUJITSU LTD·Filed 2001·Granted Sep 5, 2006·0 cites·12 claims
- 2436US8095351B2Modeling method, apparatus, and computer readable medium for creating three-dimensional analysis model of a target object to analyze data transmissionSUWADA MAKOTO·Filed 2007·Granted Jan 10, 2012·0 cites·17 claims
- 2535US8422567B2Signal transmission apparatus and methodSUWADA MAKOTO·Filed 2010·Granted Apr 16, 2013·0 cites·13 claims
- 2635US2016211243A1Laminated chip and laminated chip manufacturing methodFUJITSU LTD·Filed 2015·Application pending·0 cites
- 2733US6662132B2Noise analyzing method and apparatus and storage mediumFUJITSU LTD·Filed 2000·Granted Dec 9, 2003·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →