Inventor · disambiguated record
Masao Tanehashi
Also filed as: TANEHASHI MASAO
5 granted patents·2 pending applications·396 citations·filing 1998–2019
85Inventor score
Files withNEC CORP7
Top patents by PatentIndex Score
7 records- 0196US6400168B2Method for fabricating probe tip portion composed by coaxial cableNEC CORP·Filed 2001·Granted Jun 4, 2002·116 cites·6 claims
- 0293US6281691B1Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cableNEC CORP·Filed 1999·Granted Aug 28, 2001·119 cites·22 claims
- 0391US6310483B1Longitudinal type high frequency probe for narrow pitched electrodesNEC CORP·Filed 1998·Granted Oct 30, 2001·116 cites·27 claims
- 0475US6242930B1High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachableNEC CORP·Filed 1998·Granted Jun 5, 2001·41 cites·23 claims
- 0539US2020403701A1Equalizer device, communication system, and equalization methodNEC CORP·Filed 2019·Application pending·0 cites
- 0639US2020403700A1Equalizer device, communication system, and equalization methodNEC CORP·Filed 2019·Application pending·0 cites
- 0733US6229321B1Process for manufacturing high frequency multichip module enabling independent test of bare chipNEC CORP·Filed 1999·Granted May 8, 2001·4 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →