Inventor · disambiguated record
Masaaki Tanimura
Also filed as: TANIMURA MASAAKI
10 granted patents·3 pending applications·178 citations·filing 1997–2024
88Inventor score
Top patents by PatentIndex Score
13 records- 0191US5880998ASynchronous semiconductor memory device in which current consumed by input buffer circuit is reducedMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Mar 9, 1999·108 cites·16 claims
- 0276US6750672B2Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the sameRENESAS TECH CORP·Filed 2002·Granted Jun 15, 2004·19 cites·13 claims
- 0370US6784684B2Testing apparatus including testing board having wirings connected to common point and method of testing semiconductor device by composing signalsRENESAS TECH CORP·Filed 2002·Granted Aug 31, 2004·14 cites·10 claims
- 0464US7222279B2Semiconductor integrated circuit and test system for testing the sameRENESAS TECH CORP·Filed 2003·Granted May 22, 2007·10 cites·4 claims
- 0561US2025172609A1Probe testing apparatus, probe testing system and probe cardRENESAS ELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0659US11372042B2Semiconductor device and burn-in test method thereofRENESAS ELECTRONICS CORP·Filed 2020·Granted Jun 28, 2022·0 cites·13 claims
- 0759US6317373B1Semiconductor memory device having a test mode and semiconductor testing method utilizing the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Nov 13, 2001·12 cites·11 claims
- 0855US6479363B1Semiconductor integrated circuit and method for testing the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Nov 12, 2002·9 cites·6 claims
- 0954US12078659B2Method of inspecting semiconductor device, semiconductor device, and probe cardRENESAS ELECTRONICS CORP·Filed 2022·Granted Sep 3, 2024·0 cites·12 claims
- 1054US6774657B2Apparatus and method of inspecting semiconductor integrated circuitRENESAS TECH CORP·Filed 2000·Granted Aug 10, 2004·6 cites·11 claims
- 1144US10608659B2A/D converter and semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2019·Granted Mar 31, 2020·0 cites·12 claims
- 1238US2007198885A1Semiconductor integrated circuit and test system for testing the sameRENESAS TECH CORP·Filed 2007·Application pending·0 cites
- 1333US2015365049A1Semiconductor integrated circuit device and manufacturing method of electronic device using the sameRENESAS ELECTRONICS CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →