Inventor · disambiguated record
Max Van Der Star
Also filed as: VAN DER STAR MAX
2 granted patents·67 citations·filing 1990–1993
66Inventor score
Technology areasG01R
Files withPHILIPS CORP2
Top patents by PatentIndex Score
2 records- 0167US5477548AMethod for testing an integrated circuit means having a hierarchical organization of at least three levels, and integrated circuit means and integrated circuit suitable for being so testedPHILIPS CORP·Filed 1993·Granted Dec 19, 1995·34 cites·12 claims
- 0266US5008618AScan test apparatus for asynchronous circuitryPHILIPS CORP·Filed 1990·Granted Apr 16, 1991·33 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →