Inventor · disambiguated record
Masafumi Watanabe
Also filed as: WATANABE MASAFUMI
53 granted patents·20 pending applications·389 citations·filing 1977–2025
98Inventor score
Files withNEC CORP27HITACHI HIGH TECH SCIENCE CORP9WATANABE MASAFUMI7MITSUBISHI GAS CHEMICAL CO5NEC ELECTRONICS CORP5
Top patents by PatentIndex Score
73 records- 0197US4130900AMemory with common read/write data line and write-in latch circuitTOKYO SHIBAURA ELECTRIC CO·Filed 1977·Granted Dec 19, 1978·89 cites·6 claims
- 0295US7545223B2PLL circuitNEC ELECTRONICS CORP·Filed 2007·Granted Jun 9, 2009·32 cites·9 claims
- 0394US7752273B2Group communication system based on presence information and client deviceNEC CORP·Filed 2005·Granted Jul 6, 2010·65 cites·24 claims
- 0491US8024816B2Approach method for probe and sample in scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2010·Granted Sep 20, 2011·13 cites·7 claims
- 0590US7224973B2Communication agent apparatusNEC CORP·Filed 2005·Granted May 29, 2007·23 cites·11 claims
- 0689US7814120B2List management server for managing updating of list by third-party terminal, list management system, list managing method, and programNEC CORP·Filed 2006·Granted Oct 12, 2010·22 cites·16 claims
- 0787US7990191B2Digital phase-locked loopRENESAS ELECTRONICS CORP·Filed 2010·Granted Aug 2, 2011·10 cites·9 claims
- 0885US7595671B2PLL circuitNEC ELECTRONICS CORP·Filed 2007·Granted Sep 29, 2009·14 cites·12 claims
- 0981US9899198B2Method for analyzing evolved gas and evolved gas analyzerHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Feb 20, 2018·3 cites·5 claims
- 1081US7844667B2Presence system and information processing equipment, dynamic buddy list generation method in presence system, and presence notification destination controlling method and its program for use with presence systemNEC CORP·Filed 2004·Granted Nov 30, 2010·22 cites·12 claims
- 1179US8621660B2Probe shape evaluation method for a scanning probe microscopeHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Dec 31, 2013·5 cites·2 claims
- 1278US9831077B2Method for analyzing evolved gas and evolved gas analyzerHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Nov 28, 2017·2 cites·21 claims
- 1377US2025385453A1Connector-equipped wire harness and method of manufacturing sameYAZAKI CORP·Filed 2025·Application pending·0 cites
- 1474US7953811B2Presence system and information processing equipment, dynamic buddy list generation method in presence system, and presence notification destination controlling method and its program for use with presence systemNEC CORP·Filed 2009·Granted May 31, 2011·4 cites·2 claims
- 1574US7564293B2Signal conversion circuitNEC ELECTRONICS CORP·Filed 2006·Granted Jul 21, 2009·8 cites·13 claims
- 1673US10554383B2Analysis system, analysis method, and storage mediumNEC CORP·Filed 2015·Granted Feb 4, 2020·2 cites·18 claims
- 1773US9823208B2Method for measuring spreading resistance and spreading resistance microscopeHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Nov 21, 2017·1 cites·6 claims
- 1873US7427744B2Piezoelectric actuator and scanning probe microscope using the sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Sep 23, 2008·5 cites·10 claims
- 1972US11847216B2Analysis device, analysis method and computer-readable recording mediumNEC CORP·Filed 2022·Granted Dec 19, 2023·0 cites·12 claims
- 2071US2025358929A1Connection circuit and method of manufacturing connection circuitYAZAKI CORP·Filed 2025·Application pending·0 cites
- 2170US7368612B2Method of producing high-purity hydroxypivalaldehyde and/or dimer thereofMITSUBISHI GAS CHEMICAL CO·Filed 2006·Granted May 6, 2008·2 cites·14 claims
- 2268US9067950B2Process for producing spiroglycolWATANABE MASAFUMI·Filed 2011·Granted Jun 30, 2015·1 cites·12 claims
- 2367US4764959ASingle-chip microcomputer with encryptable function on program memoryTOSHIBA KK·Filed 1984·Granted Aug 16, 1988·41 cites·10 claims
- 2465US10528730B2Analysis device, analysis method, and storage medium in which analysis program is recordedNEC CORP·Filed 2015·Granted Jan 7, 2020·1 cites·18 claims
- 2565US10063277B2Clock control circuit, demodulation device and spread spectrum methodRENESAS ELECTRONICS CORP·Filed 2017·Granted Aug 28, 2018·1 cites·5 claims
- 2664US11640463B2Analysis device, analysis method and computer-readable recording mediumNEC CORP·Filed 2019·Granted May 2, 2023·0 cites·19 claims
- 2763US2024127983A1Wire harness manufacturing apparatus and wire harness manufacturing methodYAZAKI CORP·Filed 2023·Application pending·0 cites
- 2862US11436325B2Analysis device, analysis method, and storage medium in which analysis program is recordedNEC CORP·Filed 2019·Granted Sep 6, 2022·0 cites·13 claims
- 2962US7945679B2Presence service system, a presence apparatus, a presence service method, and a presence service programNEC CORP·Filed 2006·Granted May 17, 2011·2 cites·47 claims
- 3061US7153999B2Production of dimethylolcarboxylic acidMITSUBISHI GAS CHEMICAL CO·Filed 2002·Granted Dec 26, 2006·3 cites·17 claims
- 3161US7087800B2Process for producing a polyolMITSUBISHI GAS CHEMICAL CO·Filed 2001·Granted Aug 8, 2006·3 cites·13 claims
- 3260US9729194B2Clock control circuit, demodulation device and spread spectrum methodRENESAS ELECTRONICS CORP·Filed 2013·Granted Aug 8, 2017·1 cites·8 claims
- 3358US10360378B2Analysis device, analysis method and computer-readable recording mediumNEC CORP·Filed 2014·Granted Jul 23, 2019·0 cites·16 claims
- 3458US8601609B2Friction force microscopeYASUTAKE MASATOSHI·Filed 2012·Granted Dec 3, 2013·1 cites·12 claims
- 3558US7251987B2Scanning probe microscope and measuring method by means of the sameSII NANOTECHNOLOGY INC·Filed 2005·Granted Aug 7, 2007·2 cites·15 claims
- 3658US2010287194A1Presence-at-home information acquisition systemWATANABE MASAFUMI·Filed 2008·Application pending·0 cites
- 3757US12045342B2Information processing device, display method, and non-transitory computer readable mediumNEC CORP·Filed 2019·Granted Jul 23, 2024·0 cites·18 claims
- 3857US8001831B2Positioning apparatus and scanning probe microscope employing the sameSII NANOTECHNOLOGY INC·Filed 2008·Granted Aug 23, 2011·2 cites·9 claims
- 3956US7926328B2Sample manipulating apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Apr 19, 2011·2 cites·12 claims
- 4055US11639141B2Exterior member for electric wire and wire harnessYAZAKI CORP·Filed 2021·Granted May 2, 2023·0 cites·6 claims
- 4154US11860604B2Analysis assistance apparatus, analysis assistance method, and computer-readable recording mediumNEC CORP·Filed 2018·Granted Jan 2, 2024·0 cites·9 claims
- 4253US2024085879A1Program analysis assistance apparatus, program analysis assistance method, and computer readable recording mediumNEC CORP·Filed 2021·Application pending·0 cites
- 4351US4144587ACounting level "1" bits to minimize ROM active elementsTOKYO SHIBAURA ELECTRIC CO·Filed 1977·Granted Mar 13, 1979·7 cites·2 claims
- 4450US2011173228A1An information providing apparatus, an information providing system, an information providing program and an information providing methodNEC CORP·Filed 2009·Application pending·0 cites
- 4549US12061730B2Security assessment apparatus, security assessment method, and non-transitory computer readable mediumNEC CORP·Filed 2019·Granted Aug 13, 2024·0 cites·18 claims
- 4649US8492596B2Process for production of ditrimethylolpropaneWATANABE MASAFUMI·Filed 2008·Granted Jul 23, 2013·0 cites·12 claims
- 4749US8458272B2Presence system and information processing equipment, dynamic buddy list generation method in presence system, and presence notification destination controlling method and its program for use with presence systemITO NAOKO·Filed 2010·Granted Jun 4, 2013·0 cites·15 claims
- 4848US2005261506A1Process for producing spiroglycolWATANABE MASAFUMI·Filed 2005·Application pending·0 cites
- 4947US11646188B2Apparatus and method for analyzing evolved gasHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted May 9, 2023·0 cites·6 claims
- 5047US11579596B2Plant monitoring apparatus, plant monitoring method, and computer readable recording mediumNEC CORP·Filed 2018·Granted Feb 14, 2023·0 cites·6 claims
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →