Inventor · disambiguated record
Masahiro Watanabe
Also filed as: MIYAUCHI YASUSHI · WATANABE MASAHIRO · WATANABE SABURO · YASUSHI MIYAUCHI
457 granted patents·100 pending applications·7,217 citations·filing 1974–2025
99Inventor score
Top patents by PatentIndex Score
557 records- 0199US8210275B2Power toolsSUZUKI HITOSHI·Filed 2011·Granted Jul 3, 2012·126 cites·11 claims
- 0299US7896098B2Power toolsMAKITA CORP·Filed 2006·Granted Mar 1, 2011·65 cites·18 claims
- 0399US7692144B2Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatusHITACHI LTD·Filed 2007·Granted Apr 6, 2010·42 cites·15 claims
- 0499US7036605B2Power toolsMAKITA CORP·Filed 2003·Granted May 2, 2006·110 cites·15 claims
- 0599US6687567B2Power toolsMAKITA CORP·Filed 2003·Granted Feb 3, 2004·147 cites·14 claims
- 0699US6607041B2Power toolsMAKITA CORP·Filed 2001·Granted Aug 19, 2003·221 cites·19 claims
- 0799US6598684B2Impact power toolsMAKITA CORP·Filed 2001·Granted Jul 29, 2003·158 cites·18 claims
- 0899US6107637AElectron beam exposure or system inspection or measurement apparatus and its method and height detection apparatusHITACHI LTD·Filed 1998·Granted Aug 22, 2000·147 cites·34 claims
- 0999US5986263AElectron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the sameHITACHI LTD·Filed 1997·Granted Nov 16, 1999·164 cites·21 claims
- 1098US9541854B2Electroconductive member for electrophotography, process cartridge, and electrophotographic apparatusCANON KK·Filed 2015·Granted Jan 10, 2017·35 cites·9 claims
- 1198US9146482B2Electroconductive member for electrophotography, process cartridge, and electrophotographic apparatusCANON KK·Filed 2015·Granted Sep 29, 2015·37 cites·7 claims
- 1298US8852743B2Electro-conductive member for electrophotography, process cartridge, and electrophotographic apparatusCANON KK·Filed 2013·Granted Oct 7, 2014·40 cites·10 claims
- 1398US8771818B2Electrically conducting member for electrophotography, process cartridge and electrophotographic image forming apparatusCANON KK·Filed 2013·Granted Jul 8, 2014·39 cites·7 claims
- 1498US8628854B2Electro-conductive member, process cartridge, and electrophotographic apparatusCANON KK·Filed 2013·Granted Jan 14, 2014·40 cites·11 claims
- 1597US9599913B2Electrophotographic member, process cartridge and electrophotographic apparatusCANON KK·Filed 2014·Granted Mar 21, 2017·43 cites·6 claims
- 1697US9274442B2Electrophotographic image forming apparatus having charge transport layer with matrix-domain structure and charging member having concavity and protrusionCANON KK·Filed 2015·Granted Mar 1, 2016·31 cites·14 claims
- 1797US8785928B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Jul 22, 2014·33 cites·16 claims
- 1897USD588411SStainless steel vacuum flaskTIGER CORP·Filed 2007·Granted Mar 17, 2009·84 cites·1 claims
- 1997US5523181APolymer solid-electrolyte composition and electrochemical cell using the compositionWATANABE MASAHIRO·Filed 1993·Granted Jun 4, 1996·151 cites·6 claims
- 2096USD977916SVacuum bottleTIGER CORP·Filed 2021·Granted Feb 14, 2023·25 cites·1 claims
- 2196US11417556B2Electrostatic chuck and processing apparatusTOTO LTD·Filed 2020·Granted Aug 16, 2022·5 cites·16 claims
- 2296US9382611B2Sputtering target, method for manufacturing sputtering target, and method for forming thin filmYAMAZAKI SHUNPEI·Filed 2012·Granted Jul 5, 2016·17 cites·16 claims
- 2396US9304145B2Inspection method and its apparatus for thermal assist type magnetic head elementHITACHI HIGH TECH FINE SYSTEMS CORP·Filed 2015·Granted Apr 5, 2016·68 cites·16 claims
- 2496US8889477B2Method for forming thin film utilizing sputtering targetYAMAZAKI SHUNPEI·Filed 2012·Granted Nov 18, 2014·16 cites·33 claims
- 2596US7320368B2Power impact toolMAKITA CORP·Filed 2006·Granted Jan 22, 2008·43 cites·8 claims
- 2696US6465781B1Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatusHITACHI LTD·Filed 2000·Granted Oct 15, 2002·85 cites·25 claims
- 2796US6333510B1Electron beam exposure or system inspection of measurement apparatus and its method and height detection apparatusHITACHI LTD·Filed 2000·Granted Dec 25, 2001·44 cites·12 claims
- 2896US4931168AGas permeable electrodeWATANABE MASAHIRO·Filed 1989·Granted Jun 5, 1990·118 cites·11 claims
- 2995US11276602B2Electrostatic chuck and processing apparatusTOTO LTD·Filed 2020·Granted Mar 15, 2022·4 cites·15 claims
- 3095US10267745B2Defect detection method and defect detection device and defect observation device provided with sameHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 23, 2019·7 cites·6 claims
- 3195US9905516B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Feb 27, 2018·12 cites·16 claims
- 3295US9224758B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Dec 29, 2015·18 cites·14 claims
- 3395US8745870B2Regenerated elastic roller manufacturing process, regenerated elastic roller, electropohotographic process cartridge, and electropohotographic image forming apparatusKAWAMURA KUNIMASA·Filed 2012·Granted Jun 10, 2014·14 cites·3 claims
- 3495US7329889B2Electron beam apparatus and method with surface height calculator and a dual projection optical unitHITACHI LTD·Filed 2005·Granted Feb 12, 2008·17 cites·6 claims
- 3595US5766787ASolid polymer electrolyte compositionTANAKA PRECIOUS METAL IND·Filed 1995·Granted Jun 16, 1998·163 cites·10 claims
- 3695US5677755AMethod and apparatus for pattern exposure, mask used therefor, and semiconductor integrated circuit produced by using themHITACHI LTD·Filed 1994·Granted Oct 14, 1997·147 cites·39 claims
- 3795US5246792AStructure of ion exchange membraneTANAKA PRECIOUS METAL IND·Filed 1992·Granted Sep 21, 1993·77 cites·3 claims
- 3894US9599914B2Electrophotographic member having bow-shaped resin particles defining concavity and protrusion at surface thereofCANON KK·Filed 2016·Granted Mar 21, 2017·12 cites·6 claims
- 3994US8371708B2Electric power toolMAKITA CORP·Filed 2009·Granted Feb 12, 2013·38 cites·5 claims
- 4094US8212227B2Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatusWATANABE MASAHIRO·Filed 2010·Granted Jul 3, 2012·12 cites·10 claims
- 4194US7871309B2Polishing padTOYO TIRE & RUBBER CO·Filed 2005·Granted Jan 18, 2011·30 cites·29 claims
- 4294US6952492B2Method and apparatus for inspecting a semiconductor deviceHITACHI LTD·Filed 2001·Granted Oct 4, 2005·50 cites·18 claims
- 4394US6753518B2Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatusHITACHI LTD·Filed 2001·Granted Jun 22, 2004·35 cites·17 claims
- 4494US5231567AManufacturing planning systemHITACHI LTD·Filed 1991·Granted Jul 27, 1993·134 cites·11 claims
- 4593US10025216B2Charging member with electro-conductive elastic layer having exposed bowl-shaped resin particles, process cartridge and electrophotographic apparatusCANON KK·Filed 2016·Granted Jul 17, 2018·8 cites·6 claims
- 4693US8005051B2Re-transmission control method and relay station apparatus in a relay communication systemFUJITSU LTD·Filed 2007·Granted Aug 23, 2011·33 cites·12 claims
- 4793US7727134B2Developing roller, process for its production, developing assembly and image forming apparatusCANON KABUSHIKI TOKYO·Filed 2006·Granted Jun 1, 2010·30 cites·13 claims
- 4893US6900888B2Method and apparatus for inspecting a pattern formed on a substrateHITACHI HIGH TECH CORP·Filed 2003·Granted May 31, 2005·38 cites·23 claims
- 4993US5472799ASolid polymer electrolyte fuel cellTANAKA PRECIOUS METAL IND·Filed 1993·Granted Dec 5, 1995·117 cites·2 claims
- 5092US8013989B2Defects inspecting apparatus and defects inspecting methodHITACHI HIGH TECH CORP·Filed 2010·Granted Sep 6, 2011·7 cites·16 claims
Showing the top 50 of 557 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →