Inventor · disambiguated record
Masahiko Yomoto
Also filed as: YOMOTO MASAHIKO
3 granted patents·230 citations·filing 1987–1999
78Inventor score
Files withNIKON CORP3
Top patents by PatentIndex Score
3 records- 0191US4890245AMethod for measuring temperature of semiconductor substrate and apparatus thereforNIKON CORP·Filed 1987·Granted Dec 26, 1989·81 cites·23 claims
- 0288US4859832ALight radiation apparatusNIKON CORP·Filed 1987·Granted Aug 22, 1989·93 cites·16 claims
- 0377US6323952B1Flatness measuring apparatusNIKON CORP·Filed 1999·Granted Nov 27, 2001·56 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →