Inventor · disambiguated record
Masahiko Yoshiki
Also filed as: YOSHIKI MASAHIKO
10 granted patents·4 pending applications·55 citations·filing 1992–2024
86Inventor score
Top patents by PatentIndex Score
14 records- 0183US7375327B2Method and device for measuring quantity of wearTOSHIBA KK·Filed 2005·Granted May 20, 2008·8 cites·14 claims
- 0274US2024309523A1Electrode, membrane electrode assembly, electrochemical cell, stack, and electrolyzerTOSHIBA KK·Filed 2024·Application pending·0 cites
- 0372US7416967B2Semiconductor device, and method for manufacturing the sameTOSHIBA KK·Filed 2006·Granted Aug 26, 2008·3 cites·10 claims
- 0465US8129792B2Semiconductor device and method for manufacturing the sameICHIHARA REIKA·Filed 2008·Granted Mar 6, 2012·3 cites·15 claims
- 0558US5746829AImpurity concentrator and analyzerTOSHIBA KK·Filed 1996·Granted May 5, 1998·21 cites·10 claims
- 0656US5598025ASemiconductor device comprises an impurity layer having boron ions in the form of clusters of icosahedron structureTOSHIBA KK·Filed 1995·Granted Jan 28, 1997·17 cites·3 claims
- 0754US7768077B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2009·Granted Aug 3, 2010·0 cites·29 claims
- 0853US2009032884A1Semiconductor device, and method for manufacturing the sameTOSHIBA KK·Filed 2008·Application pending·0 cites
- 0950US7737503B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2007·Granted Jun 15, 2010·0 cites·26 claims
- 1048US7358492B2Apparatus, method, and computer program product for deconvolution analysisTOSHIBA KK·Filed 2006·Granted Apr 15, 2008·0 cites·12 claims
- 1148US2004011957A1Method and device for measuring quantity of wearTOSHIBA KK·Filed 2003·Application pending·0 cites
- 1247US8169040B2Semiconductor device and method for manufacturing the sameTSUCHIYA YOSHINORI·Filed 2010·Granted May 1, 2012·0 cites·28 claims
- 1337US2007057335A1Semiconductor deviceTSUCHIYA YOSHINORI·Filed 2006·Application pending·0 cites
- 1431US5413943ASemiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 1992·Granted May 9, 1995·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →