Inventor · disambiguated record
Masayuki Yoshiyama
Also filed as: YOSHIYAMA MASAYUKI
5 granted patents·29 citations·filing 1998–2023
71Inventor score
Files withFUJIKURA LTD1KAWASAKI MICROELECTRONICS INC1KAWASAKI STEEL CO1MEGACHIPS CORP1YOSHIYAMA MASAYUKI1
Top patents by PatentIndex Score
5 records- 0174US6560147B2Semiconductor device having scan test circuit that switches clock signal between shift mode and capture mode, and method of testing the semiconductor deviceKAWASAKI MICROELECTRONICS INC·Filed 2002·Granted May 6, 2003·23 cites·13 claims
- 0257US12095435B2High frequency variable attenuation circuitFUJIKURA LTD·Filed 2023·Granted Sep 17, 2024·0 cites·6 claims
- 0341US9184853B2Reception deviceMEGACHIPS CORP·Filed 2013·Granted Nov 10, 2015·0 cites·22 claims
- 0431US6272656B1Semiconductor integrated circuit including test facilitation circuit and test method thereofKAWASAKI STEEL CO·Filed 1998·Granted Aug 7, 2001·6 cites·20 claims
- 0530US8930802B2Receiving apparatus and method that detect reception of serial data having a plurality of blocksYOSHIYAMA MASAYUKI·Filed 2012·Granted Jan 6, 2015·0 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →