Inventor · disambiguated record
Meir Kalech
Also filed as: KALECH MEIR
7 granted patents·63 citations·filing 2007–2018
81Inventor score
Files withB G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV3B G NEGEV TECH AND APPLICATIONS LTD1IBM1KHALASTCHI ELIAHU1SAMSUNG ELECTRONICS CO LTD1
Top patents by PatentIndex Score
7 records- 0186US9218232B2Anomaly detection methods, devices and systemsKHALASTCHI ELIAHU·Filed 2012·Granted Dec 22, 2015·42 cites·12 claims
- 0281US10437702B2Data-augmented software diagnosis method and a diagnoser thereforB G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV·Filed 2017·Granted Oct 8, 2019·6 cites·13 claims
- 0381US9728014B2Sensor fault detection and diagnosis for autonomous systemsB G NEGEV TECH AND APPLICATIONS LTD·Filed 2014·Granted Aug 8, 2017·9 cites·7 claims
- 0476US9934131B2Using model-based diagnosis to improve software testingB G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV·Filed 2015·Granted Apr 3, 2018·4 cites·10 claims
- 0567US10621061B2Combined model-based approach and data driven prediction for troubleshooting faults in physical systemsB G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV·Filed 2017·Granted Apr 14, 2020·2 cites·17 claims
- 0651US8038061B2Voting by peers with limited resourcesSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 18, 2011·0 cites·29 claims
- 0750US10901979B2Generating responses to queries based on selected value assignmentsIBM·Filed 2018·Granted Jan 26, 2021·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →