Inventor · disambiguated record
Megumi Kimura
Also filed as: KIMURA MEGUMI
15 granted patents·6 pending applications·404 citations·filing 1990–2022
91Inventor score
Files withSUZUKI KEITA5HITACHI HIGH TECH CORP3KIMURA MEGUMI3OLYMPUS MEDICAL SYSTEMS CORP3HITACHI LTD2
Top patents by PatentIndex Score
21 records- 0193US9072538B2Treatment tool for endoscopeSUZUKI KEITA·Filed 2011·Granted Jul 7, 2015·112 cites·3 claims
- 0293US8551086B2Endoscopic treatment toolKIMURA MEGUMI·Filed 2011·Granted Oct 8, 2013·236 cites·4 claims
- 0376US7824407B2Treatment tool for endoscopeOLYMPUS MEDICAL SYSTEMS CORP·Filed 2006·Granted Nov 2, 2010·16 cites·15 claims
- 0471US9237918B2Endoscope treatment toolOLYMPUS CORP·Filed 2014·Granted Jan 19, 2016·5 cites·10 claims
- 0562US8647344B2Treatment instrument for endoscopeSUZUKI KEITA·Filed 2011·Granted Feb 11, 2014·2 cites·5 claims
- 0662US7691104B2Endoscopic treatment toolOLYMPUS MEDICAL SYSTEMS CORP·Filed 2007·Granted Apr 6, 2010·3 cites·4 claims
- 0759US9375257B2High-frequency treatment instrumentSUZUKI KEITA·Filed 2006·Granted Jun 28, 2016·1 cites·6 claims
- 0857US8725272B2High-frequency treatment instrumentKIMURA MEGUMI·Filed 2011·Granted May 13, 2014·1 cites·7 claims
- 0955US8186035B2Method for manufacturing an endoscopic instrumentKANEKO TATSUYA·Filed 2010·Granted May 29, 2012·1 cites·6 claims
- 1055US5173359AComposite material for electrical applications reinforced by para-oriented aramide fibrous substance and process for preparing sameHONSHU PAPER CO LTD·Filed 1990·Granted Dec 22, 1992·26 cites·10 claims
- 1153US2025095956A1Charged particle beam inspection system and charged particle beam inspection methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1252US11170969B2Electron beam observation device, electron beam observation system, and control method of electron beam observation deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 9, 2021·0 cites·16 claims
- 1351US10629405B2Electron beam device and sample inspection methodHITACHI LTD·Filed 2019·Granted Apr 21, 2020·0 cites·13 claims
- 1451US8216247B2Endoscopic instrument and method for manufacturingKANEKO TATSUYA·Filed 2007·Granted Jul 10, 2012·1 cites·8 claims
- 1551US2010023005A1High-frequency treatment instrumentYAMAMOTO TETSUYA·Filed 2009·Application pending·0 cites
- 1649US10319562B2Charged particle beam deviceHITACHI LTD·Filed 2018·Granted Jun 11, 2019·0 cites·11 claims
- 1748US11791130B2Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 17, 2023·0 cites·28 claims
- 1847US2008125769A1High frequency treatment instrumentOLYMPUS MEDICAL SYSTEMS CORP·Filed 2007·Application pending·0 cites
- 1943US2013053844A1Treatment instrument for endoscopeSUZUKI KEITA·Filed 2012·Application pending·0 cites
- 2040US2011098703A1High-frequency treatment instrumentSUZUKI KEITA·Filed 2011·Application pending·0 cites
- 2139US2011245813A1Treatment toolKIMURA MEGUMI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →