Inventor · disambiguated record
Meng-Jung Lee
Also filed as: LEE MENG-JUNG
8 granted patents·1 pending application·3 citations·filing 2011–2025
74Inventor score
Top patents by PatentIndex Score
9 records- 0185US11804410B2Thin-film non-uniform stress evaluationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Oct 31, 2023·2 cites·20 claims
- 0279US2025323101A1Thin-film non-uniform stress evaluationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0373US12374588B2Method for evaluating non-uniform stressTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 29, 2025·0 cites·20 claims
- 0460US10657303B2Circuit encoding method and circuit structure recognition methodREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted May 19, 2020·1 cites·11 claims
- 0551US11010521B2Method of detecting relations between pins of circuit and computer program product thereofREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted May 18, 2021·0 cites·18 claims
- 0648US10783293B2Circuit design system, checking method, and non-transitory computer readable medium thereofREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted Sep 22, 2020·0 cites·20 claims
- 0746US11959956B2Circuit check method and electronic apparatusREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted Apr 16, 2024·0 cites·8 claims
- 0843US8713497B2Method of generating integrated circuit modelREALTEK SEMICONDUCTOR CORP·Filed 2013·Granted Apr 29, 2014·0 cites·9 claims
- 0935US8443320B2Extracting methods for circuit modelsLEE MENG-JUNG·Filed 2011·Granted May 14, 2013·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →