Inventor · disambiguated record
Mei-Yen Li
Also filed as: LI MEI · LI MEI-YEN
12 granted patents·150 citations·filing 1997–2022
90Inventor score
Top patents by PatentIndex Score
12 records- 0194US6307628B1Method and apparatus for CMP end point detection using confocal opticsTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Oct 23, 2001·59 cites·19 claims
- 0270US6033967AMethod for increasing capacitance in DRAM capacitors and devices formedTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Mar 7, 2000·33 cites·17 claims
- 0356US12123784B2Temperature sensing systems and methods for an electronic deviceAPPLE INC·Filed 2022·Granted Oct 22, 2024·0 cites·20 claims
- 0456US7386418B2Yield analysis methodTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Jun 10, 2008·6 cites·19 claims
- 0555US6716740B2Method for depositing silicon oxide incorporating an outgassing stepTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Apr 6, 2004·6 cites·20 claims
- 0653US6087217AMethod for improving capacitance in DRAM capacitors and devices formedTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Jul 11, 2000·16 cites·21 claims
- 0752US6812156B2Method to reduce residual particulate contamination in CVD and PVD semiconductor wafer manufacturingTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Nov 2, 2004·7 cites·21 claims
- 0850US11110637B2Co-rotating self-cleaning multi-screw extruder with speed ratio of 2.5 and extruding method thereforGUANGDONG IND POLYTECHNIC·Filed 2017·Granted Sep 7, 2021·0 cites·10 claims
- 0943US7205167B2Method to detect photoresist residue on a semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Apr 17, 2007·1 cites·23 claims
- 1043US6194249B1Method of assembly stress protectionTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Feb 27, 2001·11 cites·16 claims
- 1141US6020234AIncreasing capacitance for high density DRAM by microlithography patterningTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Feb 1, 2000·7 cites·14 claims
- 1229US6242355B1Method for insulating metal conductors by spin-on-glass and devices madeTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Jun 5, 2001·4 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →