Inventor · disambiguated record
Meng-Chun Shih
Also filed as: SHIH MENG-CHUN
22 granted patents·1 pending application·15 citations·filing 2016–2024
92Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD23
Top patents by PatentIndex Score
23 records- 0190US11429482B2Systems and methods for correcting data errors in memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 30, 2022·2 cites·20 claims
- 0287US11837312B1Magnetic memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 5, 2023·1 cites·20 claims
- 0381US12191262B2Package structure and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 0480US10665321B2Method for testing MRAM device and test apparatus thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted May 26, 2020·5 cites·20 claims
- 0579US11719742B2Semiconductor wafer testing system and related method for improving external magnetic field wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 8, 2023·0 cites·20 claims
- 0678US11749617B2Package structure and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 5, 2023·0 cites·20 claims
- 0777US12210055B2Semiconductor wafer testing system and related method for improving external magnetic field wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 0876US12040036B2Magnetic memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 16, 2024·0 cites·19 claims
- 0975US10877089B2Semiconductor wafer testing system and related method for improving external magnetic field wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 29, 2020·2 cites·20 claims
- 1074US10936413B2Systems and methods for correcting data errors in memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 2, 2021·2 cites·20 claims
- 1173US11755410B2Systems and methods for correcting data errors in memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 12, 2023·0 cites·20 claims
- 1272US2024331796A1Magnetic Memory DeviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1371US11380626B2Package structure and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 5, 2022·0 cites·20 claims
- 1470US10228998B2Systems and methods for correcting data errors in memory susceptible to data loss when subjected to elevated temperaturesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 12, 2019·2 cites·17 claims
- 1569US11726747B2Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 15, 2023·0 cites·20 claims
- 1668US11506706B2Semiconductor wafer testing system and related method for improving external magnetic field wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 22, 2022·0 cites·20 claims
- 1766US11726062B2Magnetic layer characterization system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 15, 2023·0 cites·20 claims
- 1860US10818609B2Package structure and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 27, 2020·0 cites·20 claims
- 1958US11249131B2Test apparatus and testing method using the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 15, 2022·0 cites·20 claims
- 2057US11531524B2Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 20, 2022·0 cites·20 claims
- 2154US11276649B2Devices and methods having magnetic shielding layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 15, 2022·0 cites·20 claims
- 2254US10128313B2Non-volatile memory device and structure thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Nov 13, 2018·1 cites·20 claims
- 2346US10176998B2Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jan 8, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →