Inventor · disambiguated record
Meng-Lin Yeh
Also filed as: YEH MENG-LIN
4 granted patents·1 pending application·39 citations·filing 1997–1999
75Inventor score
Top patents by PatentIndex Score
5 records- 0145US6133055AMethod of forming a test key architectureUNITED SEMICONDUCTOR CORP·Filed 1999·Granted Oct 17, 2000·15 cites·5 claims
- 0237US6046601AMethod for measuring the kink effect of a semiconductor deviceUNITED SEMICONDUCTOR CIRCUIT C·Filed 1998·Granted Apr 4, 2000·10 cites·1 claims
- 0336US5949240ATest connecting device including testkey and probe card for use in the testing of integrated circuitsUNITED SEMICONDUCTOR CORP·Filed 1997·Granted Sep 7, 1999·9 cites·9 claims
- 0425US6060900AMethod for measuring current density in a semiconductor device with kink effectUNITED SEMICONDUTOR CIRCUIT CO·Filed 1998·Granted May 9, 2000·5 cites·2 claims
- 0523US2002026298A1Method for analyzing a fabrication machine cluster using-genetic algorithmsFiled 1998·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →