Inventor · disambiguated record
Miron Abramovici
Also filed as: ABRAMOVICI MIRON
32 granted patents·4 pending applications·1,795 citations·filing 1977–2010
98Inventor score
Files withLUCENT TECHNOLOGIES INC13DAFCA INC6AGERE SYSTEMS INC4LATTICE SEMICONDUCTOR CORP4ABRAMOVICI MIRON3
Top patents by PatentIndex Score
36 records- 0199US7296201B2Method to locate logic errors and defects in digital circuitsDAFCA INC·Filed 2005·Granted Nov 13, 2007·275 cites·20 claims
- 0296US6874108B1Fault tolerant operation of reconfigurable devices utilizing an adjustable system clockAGERE SYSTEMS INC·Filed 2002·Granted Mar 29, 2005·98 cites·23 claims
- 0395US6631487B1On-line testing of field programmable gate array resourcesLATTICE SEMICONDUCTOR CORP·Filed 2000·Granted Oct 7, 2003·85 cites·26 claims
- 0495US6202182B1Method and apparatus for testing field programmable gate arraysLUCENT TECHNOLOGIES INC·Filed 1998·Granted Mar 13, 2001·147 cites·21 claims
- 0594US7058918B2Reconfigurable fabric for SoCs using functional I/O leadsDAFCA INC·Filed 2003·Granted Jun 6, 2006·61 cites·50 claims
- 0694US6034538AVirtual logic system for reconfigurable hardwareLUCENT TECHNOLOGIES INC·Filed 1998·Granted Mar 7, 2000·233 cites·25 claims
- 0794US6003150AMethod for testing field programmable gate arraysLUCENT TECHNOLOGIES INC·Filed 1997·Granted Dec 14, 1999·86 cites·15 claims
- 0893US7493434B1Determining the value of internal signals in a malfunctioning integrated circuitDAFCA INC·Filed 2005·Granted Feb 17, 2009·25 cites·12 claims
- 0990US7305635B1Serial implementation of assertion checking logic circuitDAFCA INC·Filed 2005·Granted Dec 4, 2007·26 cites·22 claims
- 1088US6973608B1Fault tolerant operation of field programmable gate arraysUNIV NORTH CAROLINA·Filed 2002·Granted Dec 6, 2005·60 cites·36 claims
- 1188US6530049B1On-line fault tolerant operation via incremental reconfiguration of field programmable gate arraysLATTICE SEMICONDUCTOR CORP·Filed 2000·Granted Mar 4, 2003·42 cites·26 claims
- 1286US7137086B2Assertion checking using two or more coresDAFCA INC·Filed 2004·Granted Nov 14, 2006·30 cites·24 claims
- 1386US6966020B1Identifying faulty programmable interconnect resources of field programmable gate arraysUNIV NORTH CAROLINA·Filed 2001·Granted Nov 15, 2005·33 cites·20 claims
- 1485US5991907AMethod for testing field programmable gate arraysLUCENT TECHNOLOGIES INC·Filed 1996·Granted Nov 23, 1999·45 cites·9 claims
- 1585US5831996ADigital circuit test generatorLUCENT TECHNOLOGIES INC·Filed 1997·Granted Nov 3, 1998·77 cites·22 claims
- 1684US6256758B1Fault tolerant operation of field programmable gate arraysAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jul 3, 2001·54 cites·12 claims
- 1783US7412343B2Methods for delay-fault testing in field-programmable gate arraysUNIV NORTH CAROLINA·Filed 2003·Granted Aug 12, 2008·37 cites·23 claims
- 1883US6108806AMethod of testing and diagnosing field programmable gate arraysLUCENT TECHNOLOGIES INC·Filed 1998·Granted Aug 22, 2000·43 cites·15 claims
- 1980US7146548B1Fixing functional errors in integrated circuitsDAFCA INC·Filed 2004·Granted Dec 5, 2006·19 cites·24 claims
- 2079US6292916B1Parallel backtracing for satisfiability on reconfigurable hardwareLUCENT TECHNOLOGIES INC·Filed 1998·Granted Sep 18, 2001·47 cites·27 claims
- 2174US5625630AIncreasing testability by clock transformationLUCENT TECHNOLOGIES INC·Filed 1996·Granted Apr 29, 1997·39 cites·10 claims
- 2272US7650545B1Programmable interconnect for reconfigurable system-on-chipAGERE SYSTEMS INC·Filed 2003·Granted Jan 19, 2010·17 cites·14 claims
- 2372US6550030B1On-line testing of the programmable logic blocks in field programmable gate arraysLATTICE SEMICONDUCTOR CORP·Filed 1999·Granted Apr 15, 2003·32 cites·29 claims
- 2470US6442732B1Virtual logic system for solving satisfiability problems using reconfigurable hardwareLUCENT TECHNOLOGIES INC·Filed 1999·Granted Aug 27, 2002·61 cites·26 claims
- 2568US7017096B2Sequential test pattern generation using clock-control design for testability structuresAGERE SYSTEMS INC·Filed 2002·Granted Mar 21, 2006·13 cites·21 claims
- 2666US6574761B1On-line testing of the programmable interconnect network in field programmable gate arraysLATTICE SEMICONDUCTOR CORP·Filed 1999·Granted Jun 3, 2003·24 cites·26 claims
- 2765US5896401AFault simulator for digital circuitryLUCENT TECHNOLOGIES INC·Filed 1997·Granted Apr 20, 1999·30 cites·20 claims
- 2861US6728917B2Sequential test pattern generation using combinational techniquesAGERE SYSTEMS INC·Filed 2001·Granted Apr 27, 2004·9 cites·28 claims
- 2959US5590135ATesting a sequential circuitLUCENT TECHNOLOGIES INC·Filed 1991·Granted Dec 31, 1996·21 cites·1 claims
- 3055US5566187AMethod for identifying untestable faults in logic circuitsLUCENT TECHNOLOGIES INC·Filed 1994·Granted Oct 15, 1996·16 cites·26 claims
- 3145US4076762AContinuous process for the removal of other hydrocarbons from saturated aliphatic hydrocarbonsENGELHARD MIN & CHEM·Filed 1977·Granted Feb 28, 1978·2 cites·17 claims
- 3241US2011148457A1Protecting electronic systems from counterfeiting and reverse-engineeringABRAMOVICI MIRON·Filed 2010·Application pending·0 cites
- 3340US5559811AMethod for identifying untestable and redundant faults in sequential logic circuits.LUCENT TECHNOLOGIES INC·Filed 1996·Granted Sep 24, 1996·8 cites·24 claims
- 3439US2011145934A1Autonomous distributed programmable logic for monitoring and securing electronic systemsABRAMOVICI MIRON·Filed 2010·Application pending·0 cites
- 3538US2006218424A1Integrated circuit with autonomous power managementABRAMOVICI MIRON·Filed 2005·Application pending·0 cites
- 3637US2008132408A1Carbon black monolith, carbon black monolith catalyst, methods for making same, and uses thereofAPPLIED TECHNOLOGY LTD PARTNER·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →