Inventor · disambiguated record
Miwako Akiyama
Also filed as: AKIYAMA MIWAKO
11 granted patents·4 pending applications·88 citations·filing 2007–2015
89Inventor score
Top patents by PatentIndex Score
15 records- 0193US7872308B2Semiconductor deviceTOSHIBA KK·Filed 2008·Granted Jan 18, 2011·22 cites·10 claims
- 0290US7910984B2Semiconductor device and method for manufacturing sameTOSHIBA KK·Filed 2009·Granted Mar 22, 2011·21 cites·17 claims
- 0388US8049270B2Semiconductor deviceTOSHIBA KK·Filed 2007·Granted Nov 1, 2011·16 cites·15 claims
- 0482US7485921B2Trench gate type MOS transistor semiconductor deviceTOSHIBA KK·Filed 2007·Granted Feb 3, 2009·10 cites·8 claims
- 0581US8410546B2Semiconductor device and DC-DC converterKAWAGUCHI YUSUKE·Filed 2009·Granted Apr 2, 2013·10 cites·5 claims
- 0670US7919811B2Semiconductor device and method for manufacturing sameTOSHIBA KK·Filed 2008·Granted Apr 5, 2011·3 cites·9 claims
- 0768US8169023B2Power semiconductor deviceAKIYAMA MIWAKO·Filed 2009·Granted May 1, 2012·4 cites·20 claims
- 0863US9105716B2Semiconductor deviceAKIYAMA MIWAKO·Filed 2010·Granted Aug 11, 2015·1 cites·7 claims
- 0957US8106454B2Power semiconductor device and method for manufacturing sameAKIYAMA MIWAKO·Filed 2008·Granted Jan 31, 2012·1 cites·12 claims
- 1047USRE46204ESemiconductor device and DC-DC converterTOSHIBA KK·Filed 2015·Granted Nov 15, 2016·0 cites·12 claims
- 1144US7927952B2Method of manufacturing semiconductor devicesTOSHIBA KK·Filed 2008·Granted Apr 19, 2011·0 cites·18 claims
- 1244US2012086073A1Power semiconductor device and method for manufacturing sameAKIYAMA MIWAKO·Filed 2011·Application pending·0 cites
- 1342US2008116512A1Semiconductor device and method of making the sameTOSHIBA KK·Filed 2007·Application pending·0 cites
- 1442US2008035992A1Semiconductor deviceTOSHIBA KK·Filed 2007·Application pending·0 cites
- 1541US2007262410A1Semiconductor device and method for manufacturingTOSHIBA KK·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →